Kay Scheffler , Dr.
Product Manager, Leica Microsystems CMS GmbH, Wetzlar
6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences
A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…
Visualizing Photoresist Residue and Organic Contamination on Wafers
As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…
Key Factors for Efficient Cleanliness Analysis
An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
Five Inverted-Microscope Advantages for Industrial Applications
With inverted microscopes, you look at samples from below since their optics are placed under the sample, with upright microscopes you look at samples from above. Traditionally, inverted microscopes…
3 Factors Determine the Damage Potential of Particles
This article discusses the 3 factors for determining the potential of a particle to cause damage to parts and components in the automotive and electronic industry. These factors include the…
Factors to Consider for a Cleanliness Analysis Solution
Choosing the right cleanliness analysis solution is important for optimal quality control. This article discusses the important factors that should be taken into account to find the solution that best…
Efficient Particle Counting and Analysis
This report discusses particle counting and analysis using optical microscopy for cleanliness of parts and components. Particle counting and analysis is a critical part of quality assurance in the…
Quality Control Under the Microscope
Fast-rising demand for electric vehicles is one of the market’s main drivers, but there are other hotspots of growth, including the rise in renewable energy installations, such as photovoltaic panels,…
Cleanliness of Automotive Components and Parts
This article discusses the ISO 16232 standard and VDA 19 guidelines and briefly summarizes the particle analysis methods. They give important criteria for the cleanliness of automotive parts and…
Keeping Particulate Contamination Under Control in Pharmaceutical Products
This article describes how a 2-methods-in-1 solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) can be utilized for identification of particulate contaminants in the…
Depth Profiling and Layer Analysis for Inspection of Materials with a 2-In-1 Solution Combining Optical Microscopy and Laser Spectroscopy
In addition to simultaneous visual and chemical inspection, a 2-methods-in-1 materials analysis solution, which combines optical microscopy and laser induced breakdown spectroscopy (LIBS), can also be…
Visual and Chemical Analysis of Steel Microstructure: Faster Rating of Steel Quality
Simultaneous visual and chemical analysis of steel non-metallic inclusions with a 2-methods-in-1 solution, using optical microscopy and laser induced breakdown spectroscopy (LIBS), is described in…
See the Structure with Microscopy - Know the Composition with Laser Spectroscopy
The advantages of a 2-in-1 materials analysis solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) for simultaneous visual and chemical inspection are described in…
