Robert Ranner
Robert Ranner, Product Manager EM Specimen Preparation at Leica Microsystems, Nanotechnology Division. He is responsible for solid state preparation instruments. Robert has ten years application experience in industrial sample preparation for TEM, SEM.
Introduction to Ultramicrotomy
When studying samples, to visualize their fine structure with nanometer scale resolution, most often electron microscopy is used. There are 2 types: scanning electron microscopy (SEM) which images the…Read article
Array Tomography for SEM 3D Reconstruction
Array tomography (AT) is a 3D image reconstruction technique for high resolution, quantitative analysis of biological structures. For optimal results, ultrathin and ordered sections are an absolute…Read article
High Resolution Array Tomography with Automated Serial Sectioning
The optimization of high resolution, 3-dimensional (3D), sub-cellular structure analysis with array tomography using an automated serial sectioning solution, achieving a high section density on the…Read article
Cross Section of an Aluminium Sample for Electron Backscattered Diffraction (EBSD)
Application Note for Leica EM TIC020, Leica EM TIC 3X - Electron backscattered diffraction (EBSD) is for example used to examine the crystallographic orientation of material. The sample preparation…Read article
Cross Sectioning of Oil Shale Rock
Application Note for Leica TIC 3X - High quality sample preparation of large area to investigate the sample in the SEM. For the mechanical preparation step diamond lapping foils of 9μm subsequently…Read article
Brief Introduction to Specimen Trimming
Before ultrathin sectioning a sample with an ultramicrotome it has to be pre-prepared. For this pre-preparation, special attention must be paid to the sample size (size of the section), location of…Read article