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Targeting Active Recycling Nuclear Pore Complexes using Cryo Confocal Microscopy
In this article, how cryo light microscopy and, in particular cryo confocal microscopy, is used to improve the reliability of cryo EM workflows is described. The quality of the EM grids and samples is…Read article
3-Dimensional Imaging of Macroscopic Defects in Aluminum Alloys
The investigation of macroscale defects in aluminum (Al) alloys with a rapid 3-dimensional (3D) imaging approach is described in this report. Aluminum (Al) alloys play an important role in the…Read article
Introduction to Ultramicrotomy
When studying samples, to visualize their fine structure with nanometer scale resolution, most often electron microscopy is used. There are 2 types: scanning electron microscopy (SEM) which images the…Read article
High Resolution Array Tomography with Automated Serial Sectioning
The optimization of high resolution, 3-dimensional (3D), sub-cellular structure analysis with array tomography using an automated serial sectioning solution, achieving a high section density on the…Read article
Visualization of DNA Molecules
Precise low angle rotary shadowing with heavy metals (like platinum) can be used in transmission electron microscopy (TEM) to observe molecular details of objects previously absorbed on a thin, low…Read article
Variety of RNAs in Peripheral Blood Cells, Plasma, and Plasma Fractions
Human peripheral blood contains RNA in cells and in extracellular membrane vesicles, microvesicles and exosomes, as well as in cell-free ribonucleoproteins. Circulating mRNAs and noncoding RNAs, being…Read article
Picea abies (L.) KARST - Sample Preparation for TEM
Application Note for Leica EM AMW - Plants (5-years old) were grown in pots filled with soil and kept in greenhouse conditions. Five weeks before harvesting the plants were transferred into growth…Read article
Maple (Acer saccharum) Leaves - High Pressure Freezing and Freeze Substitution for TEM
Application Note for Leica EM HPM100 - Leaves were immersed in hexadecene and placed under a gentle (0.3 bar) vacuum for 10 minutes to evacuate the internal air spaces. The leaves were then trimmed to…Read article
Removal of Surface Layers - Sample Preparation for SEM and TEM
Application Note for Leica EM RES102 - Sometimes it is necessary to remove surface layers to gain access to the real surface structure. That can be a native oxide, or layers coming from the…Read article
Multilayer Systems with Widely Different Sputter Rates - Sample Preparation for TEM
Application Note for Leica EM RES102 - The multi-layer system to be prepared in cross-section consists of a Si substrate, a TiN layer with a thickness of a few nm and a 500 nm W layer. All these…Read article
Correlative Cryo-Fluorescence and Cryo-Scanning Electron Microscopy as a Straightforward Tool to Study Host-Pathogen Interactions
Correlative light and electron microscopy is an imaging technique that enables identification and targeting of fluorescently tagged structures with subsequent imaging at near-to-nanometer resolution.…Read article![High resolution XTEM lattice [110] image of conventional prepared InP](https://webcdn.leica-microsystems.com/fileadmin/_processed_/b/b/csm_Compound_3_525d192774.jpg "In-Containing Compound Semiconductors - Sample Preparation for TEM")
In-Containing Compound Semiconductors - Sample Preparation for TEM
Application Note for Leica EM RES102 - Previous studies showed that surface accumulation of In occurs when InP was milled in a conventional way with Ar ions. The consequence is In islands on the…Read article
High-Resolution Carbon Coating: How much Carbon is too much?
Application Note for Leica EM ACE600 - Carbon support films are routinely used for high resolution TEM. Thickness is one of the main criteria to assess its usefulness for a particular experiment.…Read article
Each Atom Counts: Protect Your Samples Prior to FIB Processing
Application Note for Leica EM ACE600 - Focused ion beam (FIB) technology has become an indispensable tool for site-specific TEM sample preparation. It allows to extract electron transparent specimens…Read article
"Shallow Trench Isolation" Structures - Sample Preparation for TEM
Application Note for Leica EM RES102 - The cross-sectional preparation of structured semiconductor materials requires a very thorough mechanical pre-preparation. In doing this, it must be ensured that…Read article