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Advanced Quantitative Fluorescence Microscopy to Probe the Molecular Dynamics of Viral Entry
Viral entry into the host cell requires the coordination of many cellular and viral proteins in a precise order. Modern microscopy techniques are now allowing researchers to investigate these…Read article
Macroscale to Nanoscale Pore Analysis of Shale and Carbonate Rocks
Physical porosity in rocks, like shale and carbonate, has a large effect on the their storage capacity. The pore geometries also affect their permeability. Imaging the visible pore space provides…Read article
Micro-CT of Insect Larva Protocol
Species: red blood worm (midge larva) Critical point drying of midge larvae with subsequent X-ray micro-computed tomography (micro-CT) to reconstruct the inner anatomy.Read articleContrast Enhancement of Polycrystalline Metals - Sample Preparation for SEM
Application Note - Ion milling is a perfect alternative for chemical etching, especially for polycrystalline metals, such as copper. Ion milling can be used to increase the contrast of the grain…Read article
Drosophila larvae - Sample Preparation for Cryo-SEM
Application Note for Leica EM ACE900 - Drosophila larvae were sandwiched between two 3 mm aluminum slit carriers with the 100 μm cavities facing each other and high-pressure frozen with a Leica EM…Read article
Giardia lamblia - Sample Preparation for Cryo-SEM
Application Note for Leica EM ACE900 - A 100 mesh copper grid (12 um thickness) was dipped into a concentrated Giardia suspension and sandwiched between two flat 3 mm aluminum specimen carriers with…Read article
Cross Sectioning of Cadmiumsulphide (CdS) for Cathodoluminescence
Cathodoluminescence can be used to achieve spectra and high resolution images of impurity and structural defects in semicondoctors, minerals and insulating materials. This application note explains…Read article
Picea abies (L.) KARST - Sample Preparation for TEM
Application Note for Leica EM AMW - Plants (5-years old) were grown in pots filled with soil and kept in greenhouse conditions. Five weeks before harvesting the plants were transferred into growth…Read article
Cross Sectioning of Copper for Electron Backscattered Diffraction (EBSD)
Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating diffraction patterns (Kikuchi-bands). It can be used for crystal orientation mapping,…Read article
Porous Ceramics - Sample Preparation for SEM
Application Note for Leica EM RES102 - Ceramic membrane filters with pore sizes down to a few nanometres must be investigated in cross-section with regard to the structure of the pores. The smallest…Read article
Maple (Acer saccharum) Leaves - High Pressure Freezing and Freeze Substitution for TEM
Application Note for Leica EM HPM100 - Leaves were immersed in hexadecene and placed under a gentle (0.3 bar) vacuum for 10 minutes to evacuate the internal air spaces. The leaves were then trimmed to…Read article
Removal of Surface Layers - Sample Preparation for SEM and TEM
Application Note for Leica EM RES102 - Sometimes it is necessary to remove surface layers to gain access to the real surface structure. That can be a native oxide, or layers coming from the…Read article
Cross Section of Solar Cells
Application Note for Leica EM TIC020, Leica EM TIC 3X - Cross section of a complete solar cell.Read article
Cross Sectioning of a Multilayer System - Preparation of a Perfect Sample Surface for EBSD
Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern (Kikuchi-bands). It can be used for crystal orientation mapping,…Read article
High-Pressure Freezing and Freeze Substitution of Hep-2 Cells Infected with Chlamydia pneumoniae
Application Note for Leica EM HPM100 - Hep-2 cells infected with Chlamydia pneumoniae were cultured on carbon-coated 6 mm Sapphire discs. Cells were high-pressure frozen in an EM HPM100 using the 6 mm…Read article
Multilayer Systems with Widely Different Sputter Rates - Sample Preparation for TEM
Application Note for Leica EM RES102 - The multi-layer system to be prepared in cross-section consists of a Si substrate, a TiN layer with a thickness of a few nm and a 500 nm W layer. All these…Read article![High resolution XTEM lattice [110] image of conventional prepared InP](https://webcdn.leica-microsystems.com/fileadmin/_processed_/b/b/csm_Compound_3_525d192774.jpg "In-Containing Compound Semiconductors - Sample Preparation for TEM")
In-Containing Compound Semiconductors - Sample Preparation for TEM
Application Note for Leica EM RES102 - Previous studies showed that surface accumulation of In occurs when InP was milled in a conventional way with Ar ions. The consequence is In islands on the…Read article
Carbon Coating for Polymeric Materials
Application Note fo Leica EM ACE600 - A solid understanding of polymer property-structure relationships is critical to improve and shorten development routes to new products. A direct way to determine…Read article