How to Boost your Microelectronic Component Inspection Performance

Doppler, Michael

November 24, 2021

How to Boost your Microelectronic Component Inspection Performance

Overcoming the resolution criterion - Webinar On-Demand

Do you need to see more when inspecting silicon wafers or MEMS? Would you like to get sharp and detailed sample images which are similar to those from electron microscopes?

Watch this free webinar to learn more about powerful imaging & contrasting techniques that can enhance your inspection performance. You will see how to overcome the resolution criterion, without oil immersion or transfer to SEM, to achieve the inspection results you are aiming for.

The webinar recording is available in English and German.

Speaker: Michael Doppler, MSc

Michael Doppler is a Senior Advanced Workflow Specialist at Leica Microsystems. He studied Mineralogy and Economic Geology in Heidelberg, Germany and received his Master of Science (MSc) in 1990. From 1990 to 1996 he worked as Scientific Collaborator at the Mineralogy Department of the University of Geneva, Switzerland. He taught mineralogical microscopy classes in both places. Since joining Leica Microsystems in 1996, he has held various sales roles and Application Manager positions in Europe and worldwide. He has carried out numerous microscopy trainings internally and externally for Leica associates, channel partners and customers.

Key Learnings:

The basics behind powerful imaging and contrasting techniques that will give you both high resolution and contrast.
How to successfully apply these techniques to your daily inspection work - without the need for oil immersion or transfer to SEM.
Understanding how the combination of these approaches can help you improve your inspection performance.

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