How to Boost your Microelectronic Component Inspection Performance

Overcoming the resolution criterion - Webinar on-demand

Wafer Wafer.jpg

Do you need to see more when inspecting silicon wafers or MEMS? Would you like to get sharp and detailed sample images which are similar to those from electron microscopes?

Watch this free webinar to learn more about powerful imaging & contrasting techniques that can enhance your inspection performance. You will see how to overcome the resolution criterion, without oil immersion or transfer to SEM, to achieve the inspection results you are aiming for.

The webinar recording is available in English and German.

What to expect in the webinar

Key Learnings:

  • The basics behind powerful imaging and contrasting techniques that will give you both high resolution and contrast.
  • How to successfully apply these techniques to your daily inspection work - without the need for oil immersion or transfer to SEM.
  • Understanding how the combination of these approaches can help you improve your inspection performance.

Register here

By clicking SUBMIT, I agree to Leica Microsystems GmbH's Terms of Use and Privacy Policy. I understand my privacy choices regarding my personal data as detailed in the Privacy Policy.

Related Articles

Interested to know more?
Talk to our experts.

Price

I need a configuration or price info.

Demo

I need an on site or remote demo.

Service & Repair

I need repair, technical service, spare parts or service contract.

Application Support

I need assistance/training in how to operate my system properly, or how to run a specific application with my system.

Do you prefer personal consulting? Show local contacts

Beckman Coulter LinkBeckman Coulter LogoGenedata LinkIDBS LogoIDBS LinkIDBS LogoAbcam Limited LinkAbcam Limited LogoMolecular Devices LinkMolecular Devices LogoPhenomenex LinkPhenomenex LogoSciex LinkSciex LogoAldevron LinkAldevron LogoIDT LinkIDT Logo
Scroll to top