
Scienze della vita
Scienze della vita
Questo è il posto giusto per ampliare le vostre conoscenze, le capacità di ricerca e le applicazioni pratiche della microscopia in vari campi scientifici. Imparate come ottenere una visualizzazione precisa, l'interpretazione delle immagini e i progressi della ricerca. Troverete informazioni approfondite sulla microscopia avanzata, sulle tecniche di imaging, sulla preparazione dei campioni e sull'analisi delle immagini. Gli argomenti trattati comprendono la biologia cellulare, le neuroscienze e la ricerca sul cancro, con particolare attenzione alle applicazioni e alle innovazioni più avanzate.
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Cross-section Analysis for Electronics Manufacturing
This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
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High-Quality EBSD Sample Preparation
This article describes a method for EBSD sample preparation of challenging materials. The high-quality samples required for electron backscatter diffraction are prepared with broad ion-beam milling.
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Cross Section Ion Beam Milling of Battery Components
Sample Preparation of Lithium battery systems requires high quality surface preparation to evaluate their internal structure and morphology. Due to the brittle materials involved, preparing pristine…
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Ion Beam Milling Guide: Enhancing Surface Quality for High-Resolution Imaging and Analysis
In this article you can learn how to optimize the preparation quality of your samples by using the ion beam etching method with the EM TIC 3X ion beam milling machine. A short introduction of the…
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Studying the Microstructure of Natural Polymers in Fine Detail
The potential of cryogenic broad ion beam milling used in combination with scanning electron microscopy (cryo-BIB-SEM) for imaging and analyzing the microstructure of cryogenically stabilized soft…
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Practical Applications of Broad Ion Beam Milling
Mechanical polishing can be time consuming and frustrating. It can also introduce unwanted artifacts when preparing cross-sectioned samples for electron backscatter diffraction (EBSD) in the scanning…