Leica EM BAF060 Sputter Coater & Freeze Fracturing Sample Preparation for Electron Microscopy Products Home Leica Microsystems

Replaced by Leica EM ACE900 in November 2015.

The Leica EM BAF060 is a high-end sample preparation system for freeze fracturing, etching, and freeze drying of double replica, high resolution carbon/metal mix coatings for TEM and SEM analysis.

Using the Leica EM VCT100 in conjunction, conduct specimen replication by electron beam evaporation, double layer coating of specimens for cryo SEM analysis and cryo coating for cryo SEM.

The Leica EM BAF060 features an advanced microtome, flexible shadowing options with two independent electron beam sources and a load-lock transfer system.

For research use only
The Leica BAF060 - Sample Preparation System for Freeze Drying, Etching & Freeze Fracturing