Enersight Microscope Software Platform
Energized for efficiency
Devices powered by Enersight
The following Leica devices are powered by Enersight software platform, with more to be added soon.
Product | Enersight OSD (on-screen display, no PC needed) | Enersight Mobile (for tablet and mobile phones) | Enersight Desktop (for computer) |
| Emspira 3 digital microscope | x | x | x |
| Ivesta 3 Greenough stereo microscopes with camera | x | x | x |
| Flexacam c5 / i5 microscope cameras | x | x | x |
| Visoria B / M / P | - | - | x |
| K3C / K3M / K5 microscope cameras | - | - | x |
Operation | |||
| Common interface used with multiple operation modes | x | x | x |
| Simplified use with an adaptable user interface | x | x | x |
| Customizable for each user group (user management) | x | - | x |
| Automatic camera setting adjustment | x | x | x |
Image Acquisition | |||
| Focus feedback: Help reaching the max level of focus | x | - | x |
| Histogram showing brightness data to help optimize illumination | x | - | x |
Documentation | |||
| Image & video recording, gallery | x | x | x |
| Save images on a network | x (automatic save) | x (manual save) | x (automatic save) |
| Share results via email | x | x (manually) | x (manually) |
| Annotate images | x | x | x |
| Consecutive numbering of sample details | x | x | x |
| Best Image function | - | - | x |
| Shading Correction | - | - | x |
| Online Help | - | - | x |
| Report generation & saving | - | - | x |
Measurement & Analysis | |||
| Measure directly during inspection | x | x | x |
| Directly compare to reference images or overlays with tolerances | x | - | x |
| Snap-to-edge assistance for circular measurements (on OSD it is "edge detection") | x | - | x |
| HDR for higher contrast, better balanced live images | x | - | x |
| Negative mode to highlight hard-to-see details | x | x | x |
| Parallel Lines, Segment Line, Layer Thickness Measurements | - | - | x |
| Scalable Reticules | - | - | x |
| Measurement & Annotation on acquired images | - | - | x |
| Reticules for Grain Analysis | - | - | x |
General | |||
| General settings | x | x | x |
| License Control | - | - | x |
x = included, o = optional, - = not available
Popular Configurations
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Enersight dongle for optional modulesDongle option to add additional modules to Enersight Desktop
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Enersight Extended Depth of Field (EDOF)Acquire sharp images of your sample with extended depth of field (EDOF). It involves the vertical Z movement of the sample to capture in-focus image information. For each Z position, the software separates sharp focus from out-of-focus regions. A Z-stack of images is acquired and the in-focus areas are combined to make a sharp image.
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Enersight Layer ThicknessEnersight Layer Thickness: The Enersight Layer Thickness Module is a measurement tool designed for measuring layers and coatings of various materials. It identifies the thickest and thinnest parts of the layer, as well as calculating the average thickness from multiple measurement points.
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Enersight XY StitchingObserve your sample with a larger field of view and higher resolution using the Enersight XY Stitching with Manual Stage function. Multiple images over a region of the sample are captured at higher magnification and stitched together into one, showing a large area with high resolution.
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