Leica EM TXP Ion Beam Milling Systems Sample Preparation for Electron Microscopy Products Home Leica Leica Microsystems
  • Sample Preparation for Materials Science

    Sample preparation is key for observing the finest textures and details on the sample surface in high resolution. The right workflow and tools for the pre-preparation will lead to an excellently…
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  • Watchmaking Industry

    For watchmakers and in the watchmaking industry, the high precision of Leica stereo microscopes facilitates delicate assembly of watches and reliable inspection for high quality and workmanship. With…
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  • Automotive & Transportation

    We at Leica want to be your dependendable collaborators, guiding you to optimal imaging solutions for automotive and transportation, so you can stay ahead of the competition. Our smart imaging…
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  • Metals & Machine Engineering

    Your work in Metals and Machine Engineering requires microscope imaging solutions to help you assemble, inspect, measure, analyze, and document your results while ensuring the highest level of…
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  • Science Lab Topic: EM Sample Preparation

    Workflow Solutions for Industrial Research

    This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.
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  • Science Lab Topic: EM Sample Preparation

    3-Dimensional Imaging of Macroscopic Defects in Aluminum Alloys

    The investigation of macroscale defects in aluminum (Al) alloys with a rapid 3-dimensional (3D) imaging approach is described in this report. Aluminum (Al) alloys play an important role in the…
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  • Science Lab Topic: EM Sample Preparation

    Quick 3D imaging of alloy defects

    Aluminum (Al) alloys play an important role in the production of aircraft and vehicles, as well as products in other industries. Defects present in the Al alloy used for the production of aircraft,…
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Copper for Electron Backscattered Diffraction (EBSD)

    Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating diffraction patterns (Kikuchi-bands). It can be used for crystal orientation mapping,…
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of a Multilayer System - Preparation of a Perfect Sample Surface for EBSD

    Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern (Kikuchi-bands). It can be used for crystal orientation mapping,…
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  • Science Lab Topic: EM Sample Preparation

    "Shallow Trench Isolation" Structures - Sample Preparation for TEM

    Application Note for Leica EM RES102 - The cross-sectional preparation of structured semiconductor materials requires a very thorough mechanical pre-preparation. In doing this, it must be ensured that…
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  • Science Lab Topic: EM Sample Preparation

    Metal Films and Sheets - Sample Preparation for TEM

    Application Note for Leica EM RES102 - Most metal films already have a thickness that requires no further mechanical pre-preparation. Frequently, however, they are also domed, which can lead to…
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Ni/Cu on Steel for EBSD

    Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern (Kikuchi-bands). It can be used for crystal orientation mapping,…
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Painted Concrete

    Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve flat cuts of material combinations consisting of hard and soft materials. Here, cross sectioning of painted…
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of a Superconductive Wire

    Application Note for Leica EM TIC 3X - Purpose: The shape of the wire is difficult for ion beam slope cutting. Goal: Cross sectional preparation to see the structure of the wire.
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Alumina

    Application Note for Leica EM TIC 3X - Alumina is very difficult to handle and almost impossible to prepare with conventional methods. Ion beam slope cutting is a method that can achieve cross…
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of CuSn Connector of a Solar Cell

    Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve flat cross sections of soft materials or material combinations consisting of hard and soft components. The…
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Oil Shale Rock

    Application Note for Leica TIC 3X - High quality sample preparation of large area to investigate the sample in the SEM. For the mechanical preparation step diamond lapping foils of 9μm subsequently…
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  • Javier Ruiz Balbas, Laboratory Manager at Atotech Spain
    Science Lab Topic: Quality Assurance

    Inspection of Multilayer Coating in the Automotive Industry

    Today’s automotive industry use a variety of decorative and functional treatment to improve the vehicles surfaces. Traditional quality control methods to inspect these multilayer samples have proven…
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  • Science Lab Topic: EM Sample Preparation

    Electron Microscopy Sample Preparation: “The Future is Cold, Dynamic and Hybrid”

    In 2014, the renowned Electron Microscopy for Materials Science (EMAT) research lab at the University Antwerp, Belgium, and Leica Microsystems started a fruitful collaboration to establish a Leica…
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  • Science Lab Topic: EM Sample Preparation

    A Good Place for Materials Scientists and Mineralogists to prepare their EM Samples

    In June 2014, the Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie (IMPMC) of the Université Pierre et Marie Curie in Paris became a Leica reference lab for EM Sample Preparation…
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  • Science Lab Topic: EM Sample Preparation

    High Quality Sample Preparation for EBSD Analysis by Broad Ion Beam Milling

    Electron Backscatter Diffraction technique (EBSD) is known as a "surface" technique because electron diffraction is generated within a few tens of nanometers of the sample surface. Therefore, the…
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  • Science Lab Topic: EM Sample Preparation

    Preparation of Small Disk-shaped Samples for Capacitance and Pyroelectric Current Measurements

    Capacitance and pyroelectric current measurements are best suited to determine important dielectric properties of materials, e.g. the relative dielectric constant, εr, and the remnant electric…
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  • Science Lab Topic: EM Sample Preparation

    Partner Lab for EM Sample Preparation in Paris

    At the Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie (IMPMC) of the Université Pierre et Marie Curie in Paris an new lab for EM Sample Preparation welcomes researchers of…
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  • Science Lab Topic: EM Sample Preparation

    A Word on Cathodoluminescence

    Cathodoluminescence microanalysis is an emerging technique that is fast gaining popularity in the world of materials science. CL is a light emission phenomena resulting from the electron beam…
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  • Science Lab Topic: EM Sample Preparation

    University of Wollongong Electron Microscopy Centre

    The University of Wollongong has a diverse range of materials research programs that includes metallurgy for mining, manufacturing, steel making and transport; polymers for solar cells, energy storage…
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