Leica EM TXP
Ion Beam Milling
Sample Preparation for Electron Microscopy
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Leica EM TXP Target Surfacing System
Learn more about the Leica EM TXP Target surfacing System
The Leica EM TXP is a unique target preparation device especially developed for cutting, milling, drilling, grinding and polishing samples prior to examination by SEM, TEM and LM techniques.