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DM6 M LIBS Material Analysis Microscope

90% time savings: Visual & chemical material inspection 2-in-1

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Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.

Cross-section Analysis for Electronics Manufacturing

Cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc. are described in this…
Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest.

Structural and Chemical Analysis of IC-Chip Cross Sections

This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…
Optical microscope image of salt contamination on an aluminum/silicon (Al/Si) surface. Credit: Gerweck GmbH, Germany.

Microscopic Defects in Electroplating

This free on-demand webinar shows how to identify quickly root causes of defects during electroplating of components with optical microscopy and LIBS (laser spectroscopy).
User analyzing particles and fibers on a filter for cleanliness analysis with the DM6 M LIBS 2-methods-in-1 solution.

Basics in Component Cleanliness Analysis

An overview on the basics of component cleanliness and analysis solutions that can be tailored to your specific needs is presented. For the automotive industry, obtaining results rapidly, accurately,…

Cleanliness Analysis with a 2-Methods-in-1 Solution

In this article, it is examined how an overall efficient and cost-effective cleanliness analysis workflow can be achieved with a 2-methods-in-1 materials analysis solution, combining optical…
The various solutions from Leica Microsystems for cleanliness analysis.

Factors to Consider for a Cleanliness Analysis Solution

Choosing the right cleanliness analysis solution is important for optimal quality control. This article discusses the important factors that should be taken into account to find the solution that best…
Particles and fibers on a filter which will be counted and analyzed for cleanliness

Efficient Particle Counting and Analysis

This report discusses particle counting and analysis using optical microscopy for cleanliness of parts and components. Particle counting and analysis is a critical part of quality assurance in the…
A stack of lithium-ion batteries

Quality Control Under the Microscope

Fast-rising demand for electric vehicles is one of the market’s main drivers, but there are other hotspots of growth, including the rise in renewable energy installations, such as photovoltaic panels,…
When particulate contamination is present in lubricating fluids or oils, it can cause damage to parts or components leading to malfunctions.

Hydraulics in the Automotive and Aerospace Industries

Cleanliness standards relating to lubricants, hydraulic fluids, and oils, e.g., ISO 4406 and DIN 51455 are discussed in this article. Cleanliness plays a central role in the automotive and…
Particles which could be found during cleanliness analysis of parts and components.

Cleanliness of Automotive Components and Parts

This article discusses the ISO 16232 standard and VDA 19 guidelines and briefly summarizes the particle analysis methods. They give important criteria for the cleanliness of automotive parts and…
Multiple particles seen on a filter imaged with a microscope

Improving the Cleanliness Analysis Workflow

For automotive manufacturers and automotive component suppliers, obtaining cleanliness results rapidly, accurately, and reliably over the entire workflow is a significant advantage. Often for this…
Particle analysis with LIBS using the DM6 M LIBS 2-in-1 solution: Particle of brass, an alloy of copper (Cu) and zinc (Zn).

High Speed for Your Material Analysis Workflow

Learn from our expert, Dr. Konstantin Kartaschew, how the intelligent combination of light microscopy with laser-induced breakdown spectroscopy (LIBS) will truly accelerate your root-cause-analysis…

Microstructural Characterization including Compositional Analysis

Leica Microsystems' versatile upright compound microscope, DM6 M, fitted with Laser-Induced Breakdown Spectroscopy module will let you not only analyze metallographically polished samples and conduct…

Keeping Particulate Contamination Under Control in Pharmaceutical Products

This article describes how a 2-methods-in-1 solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) can be utilized for identification of particulate contaminants in the…

Fast Visual and Chemical Analysis of Contamination and Underlying Layers

Visual and chemical analysis of contamination on materials with a 2-methods-in-1 solution leading to an efficient, more complete analysis workflow is described in this report. A 2-in-1 solution,…

Depth Profiling and Layer Analysis for Inspection of Materials with a 2-In-1 Solution Combining Optical Microscopy and Laser Spectroscopy

In addition to simultaneous visual and chemical inspection, a 2-methods-in-1 materials analysis solution, which combines optical microscopy and laser induced breakdown spectroscopy (LIBS), can also be…
Printed Circuit Board (PCB)

Performing Elemental Analysis down to the Micro Scale

If you work in electronic component analysis, you will be familiar with the many challenges posed. Whether you are identifying metallic particles or checking product authenticity, it’s important to…

Visual and Chemical Analysis of Steel Microstructure: Faster Rating of Steel Quality

Simultaneous visual and chemical analysis of steel non-metallic inclusions with a 2-methods-in-1 solution, using optical microscopy and laser induced breakdown spectroscopy (LIBS), is described in…

Simplify and Speed Up Element Analysis at the Micron Range

Learn how to get spatially resolved information about the chemical composition of elements in seconds - quickly and easily.

See the Structure with Microscopy - Know the Composition with Laser Spectroscopy

The advantages of a 2-in-1 materials analysis solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) for simultaneous visual and chemical inspection are described in…

Fields of Application

Metallography

Leica metallographic microscopes are optimized for the microstructural analysis of metals, alloys, and other materials.

Automotive & Transportation

We at Leica want to be your dependendable collaborators, guiding you to optimal imaging solutions for automotive and transportation, so you can stay ahead of the competition. Our smart imaging…

Materials & Earth Science

You need the right tools for reliable, high-quality imaging and analysis. Leica Microsystems is the single source for all your research needs. Along with expert local support, we offer a broad range…

Technical Cleanliness

For industrial and electronics manufacturers as well as non-regulated pharma applications, solutions for an efficient technical cleanliness offer significant advantages.

Automated Microscopes

Automated microscopes are very useful for applications which require many repetitious observations over a long period of time. Examples are live-cell imaging or high-throughput analysis for quality…

Material Analysis Microscopes

Materials analysis requires microscope solutions for the imaging, measurement, and analysis of features across a variety of materials like metal alloys, semiconductors, glass and ceramics, as well as…

Industrial Microscopy Markets

Maximizing uptime and achieving targets efficiently help your bottom line. Leica microscope solutions can give you insights into the smallest sample details as well as analyze, document, and report…

Metal Industry

Leica microscope solutions for the metal industry are useful for assessing the quality of materials and ensuring compliance with applicable standards.

Cross-Section Analysis for Electronics

Cross-section analysis for electronics enables detailed analysis of failure mechanisms of components like printed circuit boards (PCBs), assemblies (PCBAs), and integrated circuits (ICs).

Electronics and Semiconductor Industry

For electronics and semiconductors, solutions enabling efficient inspection, cross-section and cleanliness analysis, and R&D of PCBs, wafers, IC chips, and batteries are crucial.
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