Leica EM RES102 Ion Beam Milling Sample Preparation for Electron Microscopy Products Home Leica Microsystems

Leica EM RES102

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Thin, clean, polish, cut slopes and structure your samples with the highest level of flexibility in the Leica EM RES102. The unique ion beam milling system combines the preparation of TEM, SEM and LM samples in one single benchtop unit.

A variety of sample holders allows a diverse range of applications to be carried out. In addition to high-energy ion beam milling, the Leica EM RES102 can also be used for very gentle sample processing using low ion energy.

For research use only
Leica EM RES102 Ion beam milling system