Leica EM RES102 Ion Beam Milling Systems Sample Preparation for Electron Microscopy Products Home Leica Leica Microsystems
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  • Science Lab Topic: EM Sample Preparation

    Workflow Solutions for Industrial Research

    This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.
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  • Science Lab Topic: EM Sample Preparation

    Contrast Enhancement of Polycrystalline Metals - Sample Preparation for SEM

    Application Note - Ion milling is a perfect alternative for chemical etching, especially for polycrystalline metals, such as copper. Ion milling can be used to increase the contrast of the grain…
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  • Science Lab Topic: EM Sample Preparation

    Porous Ceramics - Sample Preparation for SEM

    Application Note for Leica EM RES102 - Ceramic membrane filters with pore sizes down to a few nanometres must be investigated in cross-section with regard to the structure of the pores. The smallest…
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  • Science Lab Topic: EM Sample Preparation

    Removal of Surface Layers - Sample Preparation for SEM and TEM

    Application Note for Leica EM RES102 - Sometimes it is necessary to remove surface layers to gain access to the real surface structure. That can be a native oxide, or layers coming from the…
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  • Science Lab Topic: EM Sample Preparation

    Multilayer Systems with Widely Different Sputter Rates - Sample Preparation for TEM

    Application Note for Leica EM RES102 - The multi-layer system to be prepared in cross-section consists of a Si substrate, a TiN layer with a thickness of a few nm and a 500 nm W layer. All these…
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  • High resolution XTEM lattice [110] image of conventional prepared InP
    Science Lab Topic: EM Sample Preparation

    In-Containing Compound Semiconductors - Sample Preparation for TEM

    Application Note for Leica EM RES102 - Previous studies showed that surface accumulation of In occurs when InP was milled in a conventional way with Ar ions. The consequence is In islands on the…
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  • Science Lab Topic: EM Sample Preparation

    "Shallow Trench Isolation" Structures - Sample Preparation for TEM

    Application Note for Leica EM RES102 - The cross-sectional preparation of structured semiconductor materials requires a very thorough mechanical pre-preparation. In doing this, it must be ensured that…
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  • Science Lab Topic: EM Sample Preparation

    Paper Samples - Sample Preparation for SEM

    Application Note for Leica EM RES102 - A coated paper sample has been prepared with ion beam slope cutting in order to test the procedure with regard to its applicability. With the use of ion beam…
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  • Science Lab Topic: EM Sample Preparation

    Metal Films and Sheets - Sample Preparation for TEM

    Application Note for Leica EM RES102 - Most metal films already have a thickness that requires no further mechanical pre-preparation. Frequently, however, they are also domed, which can lead to…
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  • Science Lab Topic: EM Sample Preparation

    Contrast Enhancement of Polished Cross Sections of Semiconductor Structures - Sample Preparation for SEM

    Application Note for Leica EM RES102 - The surfaces of polished cross sections often show fine scratches and residues of the removed material or of the abrasive material. The artefacts are strongly…
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  • Science Lab Topic: EM Sample Preparation

    Surface Modification of ZnAg Sample - Sample Preparation for SEM

    Application Note for Leica EM RES102 - By means of cleaning, polishing and contrast enhancement a soft ZnAg sample should be prepared to obtain information concerning the grain structure and…
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  • Science Lab Topic: EM Sample Preparation

    Thin Metal Foils with Coatings - Sample Preparation for SEM

    Application Note for Leica EM RES102 - Thin foils are mostly unstable because of their thickness of a few microns. This makes it difficult to do slope cutting without any protection of the sample. A…
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  • Science Lab Topic: EM Sample Preparation

    Ion Beam Polishing of Sample Surfaces - Sample Preparation for SEM

    Application Note for Leica EM RES102 - Ion milling can be used to reduce the roughness of sample surfaces. Small angles less than 6° with respect to the sample surface are necessary. The high voltage…
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  • Science Lab Topic: EM Sample Preparation

    Cleaning of Smeared Sample Surfaces - Sample Preparation for SEM

    Application Note for Leica EM RES102 - Mechanical polishing of soft materials or hard / soft material combinations is tricky. The mechanical polishing process leads very often to smearing of the soft…
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  • Science Lab Topic: EM Sample Preparation

    Ceramics - Sample Preparation for TEM

    Application Note for Leica EM RES102 - Ceramic samples are mostly very brittle, and are therefore very difficult to thin mechanically to a low starting thickness for ion beam milling. The ion beam…
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  • Science Lab Topic: EM Sample Preparation

    TEM Sample Preparation Made Easy - Prepare TEM Specimen by Broad Beam Argon Ion Milling

    Quantitative and analytical analysis at high spatial resolution places stringent demands on the quality of the produced TEM specimens. Pristine and high-quality samples are indispensible for atomic…
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