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David R. Barbero , PhD

David R. Barbero

Dr. David R. Barbero is an engineer and physicist who has over 15 years of experience in nanoscale opto-electronic materials, devices and displays. His work has been published in several top journals in Materials Science and Physics and highlighted in over 300 scientific newspapers and internet websites. He has a long experience in nano-patterning and nano-structuring of polymers and composites (optical lithography, nano-imprinting, colloidal, nanotubes, and polymer self-assembly). David obtained his PhD in Physics at the Cavendish Laboratory, University of Cambridge, UK, where he was a Marie-Curie Fellow, a European Cambridge Trust Scholar, and he was awarded the Abdus Salam runner-up prize in Physics from Cambridge University in 2009.

Optical microscope image, which is a composition of both brightfield and fluorescence illumination, showing organic contamination on a wafer surface. The inset images in the upper left corner show the brightfield image (above) and fluorescence image (below with dark background).

Visualizing Photoresist Residue and Organic Contamination on Wafers

As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…
Image of burrs (red arrows) at the edge of a battery electrode acquired with a DVM6 digital microscope.

Burr Detection During Battery Manufacturing

See how optical microscopy can be used for burr detection on battery electrodes and determination of damage potential to achieve rapid and reliable quality control during battery manufacturing.
Particles observed on the surface of a particle trap which could be used for technical cleanliness during battery production.

Battery Particle Detection During the Production Process

How battery particle detection and analysis is enhanced with optical microscopy and laser spectroscopy for rapid, reliable, and cost-effective QC during battery production is explained in this…
Particulate contamination in between moving metal plates.

Key Factors for Efficient Cleanliness Analysis

An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection for QC of materials like wafers can be challenging. Microscope solutions that offer several contrast methods enable fast and reliable defect detection and efficient workflows.
Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.

Cross-section Analysis for Electronics Manufacturing

This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
Raw widefield and THUNDER image of transversal mouse adult fiber lens section. Courtesy N. Houssin, Plagemen lab, Ohio State University, Columbus, USA.

Studying Ocular Birth Defects

This article discusses how lens formation and ocular birth defects can be studied with sharp widefield microscopy images which are acquired rapidly. The mouse ocular lens is used as a model to study…
The various solutions from Leica Microsystems for cleanliness analysis.

Factors to Consider for a Cleanliness Analysis Solution

Choosing the right cleanliness analysis solution is important for optimal quality control. This article discusses the important factors that should be taken into account to find the solution that best…
Particles and fibers on a filter which will be counted and analyzed for cleanliness

Efficient Particle Counting and Analysis

This report discusses particle counting and analysis using optical microscopy for cleanliness of parts and components. Particle counting and analysis is a critical part of quality assurance in the…
Particles which could be found during cleanliness analysis of parts and components.

Cleanliness of Automotive Components and Parts

This article discusses the ISO 16232 standard and VDA 19 guidelines and briefly summarizes the particle analysis methods. They give important criteria for the cleanliness of automotive parts and…
Electronic component

Top Challenges for Visual Inspection

This article discusses the challenges encountered when performing visual inspection and rework using a microscope. Using the right type of microscope and optical setup is paramount in order to…
Visual inspection of a PCBA with the Ivesta 3 Greenough stereo microscope.

How to Select the Right Solution for Visual Inspection

This article helps users with the decision-making process when selecting a microscope as a solution for routine visual inspection. Important factors that should be considered are described.

Introduction to 21 CFR Part 11 and Related Regulations

This article provides an overview of regulations and guidelines for electronic records (data entry, storage, signatures, and approvals) used in the USA (21 CFR Part 11), EU (GMP Annex 11), and China…

Why is Manual Visual Inspection of Medical Devices so Challenging?

This article discusses how manual visual inspection, which is prevalent in the medical device industry, can lead to inconsistent results. It also addresses the challenges quality managers and…

Keeping Particulate Contamination Under Control in Pharmaceutical Products

This article describes how a 2-methods-in-1 solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) can be utilized for identification of particulate contaminants in the…

How does an Automated Rating Solution for Steel Inclusions Work?

The rating of non-metallic inclusions (NMIs) to determine steel quality is critical for many industrial applications. For an efficient and cost-effective steel quality evaluation, an automated NMI…

Challenges Faced When Manually Rating Non-Metallic Inclusions (NMIs) to Determine Steel Quality

Rapid, accurate, and reliable rating of non-metallic inclusions (NMIs) is instrumental for the determination of steel quality. This article describes the challenges that arise from manual NMI rating,…

Reasons Why There is Growing Need for Fast and Reliable Steel Quality Rating Solutions

Steel quality is critical for the manufacturing of high-quality components and products. Fast, reliable, and accurate detection and classification of inclusions has become essential for both component…
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