Industrial
Industrial
Sumérjase en artículos detallados y seminarios web centrados en la inspección eficaz, los flujos de trabajo optimizados y la comodidad ergonómica en contextos industriales y patológicos. Los temas tratados incluyen el control de calidad, el análisis de materiales y la microscopía en patología, entre muchos otros. Este es el lugar donde obtendrá información valiosa sobre el uso de tecnologías de vanguardia para mejorar la precisión y la eficacia de los procesos de fabricación, así como el diagnóstico y la investigación patológicos precisos.
Depth of Field in Microscope Images
For microscopy imaging, depth of field is an important parameter when needing sharp images of sample areas with structures having significant changes in depth. In practice, depth of field is…
What is Empty Magnification and How can Users Avoid it
The phenomenon of “empty magnification”, which can occur while using an optical, light, or digital microscope, and how it can be avoided is explained in this article. The performance of an optical…
Rapid Semiconductor Inspection with Microscope Contrast Methods
Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…
Understanding Clearly the Magnification of Microscopy
To help users better understand the magnification of microscopy and how to determine the useful range of magnification values for digital microscopes, this article provides helpful guidelines.
Immersion Objectives
How an immersion objective, which has a liquid medium between it and the specimen being observed, helps increase the numerical aperture and microscope resolution is explained in this article.
Microscope Resolution: Concepts, Factors and Calculation
This article explains in simple terms microscope resolution concepts, like the Airy disc, Abbe diffraction limit, Rayleigh criterion, and full width half max (FWHM). It also discusses the history.
How to Boost your Microelectronic Component Inspection Performance
Do you need to see more when inspecting silicon wafers or MEMS? Would you like to get sharp and detailed sample images which are similar to those from electron microscopes?
Watch this free webinar…
The Power of Pairing Adaptive Deconvolution with Computational Clearing
Learn how deconvolution allows you to overcome losses in image resolution and contrast in widefield fluorescence microscopy due to the wave nature of light and the diffraction of light by optical…
Eyepieces, Objectives and Optical Aberrations
This article covers the components of the eyepieces and how to adjust them correctly to suit your eyes.
