EM TIC 3X Configurable Ion Beam Milling System
Create high-quality milling surfaces using three broad beams, revealing true sample structures for downstream Electron Microscopy analysis. Adaptable and flexible, the EM TIC 3X supports a broad range of experiments with easily exchangeable stages and sample holder compatibility.
Pristine surfaces empower users to obtain relevant results
Prepare high quality surface of various sample types, no matter if hard, soft, brittle, heterogenic, or heat sensitive. EM TIC3X helps reveal internal sample structures producing pristine surface quality.
Easily prepare buried structures
Never miss your target structure – even if it's a buried feature. Precisely align the sample with mask and ion guns using a stereo microscope. Observe and document the entire process.
Efficiently prepare foil samples
Prepare cross-sections of single or multiple layers of foils with minimal redeposition or delamination. Successfully mill a variety of foil types.
Simply bring your sample through the workflow
Increase efficiency and reduce handling steps with sample support compatibility. Use the same holder for EM TXP and EM TIC 3X for the whole surface preparation workflow. Keeping consistent sample mounting and orientation through the entire preparation process decreases the risk of sample damage and misalignment.
Enable a new range of experiments as needed
Get a new stage to expand your range of experiments, with no need for service support or instrument downtime, even for cryo stages.
- Standard stage
- Multiple-sample stage
- Rotary stage
- Cooling stage
- Vacuum Cryo Transfer Docking Station
EM TIC 3X is compatible with other Leica instruments including EM VCT500 and EM ACE600.
