Leica EM TIC 3X Ion Beam Milling Systems Sample Preparation for Electron Microscopy Products Home Leica Leica Microsystems
  • Sample Preparation for Materials Science

    Sample preparation is key for observing the finest textures and details on the sample surface in high resolution. The right workflow and tools for the pre-preparation will lead to an excellently…
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  • Automotive & Transportation

    We at Leica want to be your dependendable collaborators, guiding you to optimal imaging solutions for automotive and transportation, so you can stay ahead of the competition. Our smart imaging…
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  • Metals & Machine Engineering

    Your work in Metals and Machine Engineering requires microscope imaging solutions to help you assemble, inspect, measure, analyze, and document your results while ensuring the highest level of…
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  • Energy, Mining and Natural Resources

    Energizing the worlds infrastructure while maintaining sustainability is always a priority. Leica Microsystems has powerful and customizable microscopy solutions to help you get the most out of your…
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  • Iron and Steel Industry

    Your role in the Iron and Steel industry is specialized and requires individualized microscope solutions to help you inspect, analyze or document microstructure development, composition and mechanical…
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  • SEM image of the full Li-NMC electrode sample, showing the two porous layers and the metal film at the center of the structure.
    Science Lab Topic: Quality Assurance

    Cross Section Ion Beam Milling of Battery Components

    Sample Preparation of Lithium battery systems requires high quality surface preparation to evaluate their internal structure and morphology. Due to the brittle materials involved, preparing pristine…
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  • 3D reconstruction of an intercellular bridge in a C. elegans embryo
    Science Lab Topic: EM Sample Preparation

    Download EM Workflow Solutions Booklet

    This publication is a compilation of appropriate workflows for the most frequently used sample preparation methods, like Correlative Methodologies, Optogenetics & Electro-Physiology, Surface Analysis,…
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  • Science Lab Topic: EM Sample Preparation

    Exploring the Structure and Life Cycle of Viruses

    The SARS-CoV-2 outbreak started in late December 2019 and has since reached a global pandemic, leading to a worldwide battle against COVID-19. The ever-evolving electron microscopy methods offer a…
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  • EM TIC 3X
    Science Lab Topic: EM Sample Preparation

    Application Booklet for EM TIC 3X

    Today, ion beam milling is one of the most widely-used methods for preparing samples for electron microscopy. Download this 76-pages booklet today and learn how to improve your processes.
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  • Science Lab Topic: EM Sample Preparation

    Workflows and Instrumentation for Cryo-electron Microscopy

    Cryo-electron microscopy is an increasingly popular modality to study the structures of macromolecular complexes and has enabled numerous new insights in cell biology. In recent years, cryo-electron…
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  • Science Lab Topic: EM Sample Preparation

    Introduction to Ion Beam Etching with the EM TIC 3X

    In this article you can learn how to optimize the preparation quality of your samples by using the ion beam etching method with the EM TIC 3X ion beam milling machine. A short introduction of the…
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  • Science Lab Topic: EM Sample Preparation

    Workflow Solutions for Industrial Research

    This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.
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  • Science Lab Topic: EM Sample Preparation

    Studying the Microstructure of Natural Polymers in Fine Detail

    The potential of cryogenic broad ion beam milling used in combination with scanning electron microscopy (cryo-BIB-SEM) for imaging and analyzing the microstructure of cryogenically stabilized soft…
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  • Science Lab Topic: EM Sample Preparation

    Practical Applications of Broad Ion Beam Milling

    Mechanical polishing can be time consuming and frustrating. It can also introduce unwanted artifacts when preparing cross-sectioned samples for electron backscatter diffraction (EBSD) in the scanning…
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Cadmiumsulphide (CdS) for Cathodoluminescence

    Cathodoluminescence can be used to achieve spectra and high resolution images of impurity and structural defects in semicondoctors, minerals and insulating materials. This application note explains…
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Copper for Electron Backscattered Diffraction (EBSD)

    Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating diffraction patterns (Kikuchi-bands). It can be used for crystal orientation mapping,…
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  • Science Lab Topic: EM Sample Preparation

    Cross Section of Solar Cells

    Application Note for Leica EM TIC020, Leica EM TIC 3X - Cross section of a complete solar cell.
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of a Multilayer System - Preparation of a Perfect Sample Surface for EBSD

    Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern (Kikuchi-bands). It can be used for crystal orientation mapping,…
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Ni/Cu on Steel for EBSD

    Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern (Kikuchi-bands). It can be used for crystal orientation mapping,…
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Painted Concrete

    Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve flat cuts of material combinations consisting of hard and soft materials. Here, cross sectioning of painted…
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of a Superconductive Wire

    Application Note for Leica EM TIC 3X - Purpose: The shape of the wire is difficult for ion beam slope cutting. Goal: Cross sectional preparation to see the structure of the wire.
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  • Science Lab Topic: EM Sample Preparation

    Cross Section of an Aluminium Sample for Electron Backscattered Diffraction (EBSD)

    Application Note for Leica EM TIC020, Leica EM TIC 3X - Electron backscattered diffraction (EBSD) is for example used to examine the crystallographic orientation of material. The sample preparation…
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Alumina

    Application Note for Leica EM TIC 3X - Alumina is very difficult to handle and almost impossible to prepare with conventional methods. Ion beam slope cutting is a method that can achieve cross…
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of CuSn Connector of a Solar Cell

    Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve flat cross sections of soft materials or material combinations consisting of hard and soft components. The…
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Oil Shale Rock

    Application Note for Leica TIC 3X - High quality sample preparation of large area to investigate the sample in the SEM. For the mechanical preparation step diamond lapping foils of 9μm subsequently…
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Rubber (Tire)

    Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve cross sections of soft materials or material combinations consisting of hard and soft components.
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  • Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Basalt Fibres

    Application Note for Leica EM TIC 3X - Material Research. Purpose: The fibres are embedded in a soft matrix. That makes it difficult to prepare a cross section. Goal: Cross section of the basalt…
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  • Science Lab Topic: EM Sample Preparation

    Triple-beam Ar-Ion-Milling with a Rotary Stage to Decorate Grain Boundaries and Substructures in Rock Salt

    Decoration of grain boundaries in polycrystalline rocks has a long tradition in Structural Geology as in a monomineralic rock the recrystallized grain size is a good indicator for the paleostress…
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  • Science Lab Topic: EM Sample Preparation

    Electron Microscopy Sample Preparation: “The Future is Cold, Dynamic and Hybrid”

    In 2014, the renowned Electron Microscopy for Materials Science (EMAT) research lab at the University Antwerp, Belgium, and Leica Microsystems started a fruitful collaboration to establish a Leica…
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  • Science Lab Topic: EM Sample Preparation

    A Good Place for Materials Scientists and Mineralogists to prepare their EM Samples

    In June 2014, the Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie (IMPMC) of the Université Pierre et Marie Curie in Paris became a Leica reference lab for EM Sample Preparation…
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  • Science Lab Topic: EM Sample Preparation

    High Quality Sample Preparation for EBSD Analysis by Broad Ion Beam Milling

    Electron Backscatter Diffraction technique (EBSD) is known as a "surface" technique because electron diffraction is generated within a few tens of nanometers of the sample surface. Therefore, the…
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  • Science Lab Topic: EM Sample Preparation

    Partner Lab for EM Sample Preparation in Paris

    At the Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie (IMPMC) of the Université Pierre et Marie Curie in Paris an new lab for EM Sample Preparation welcomes researchers of…
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  • Science Lab Topic: EM Sample Preparation

    Analysis of Oil Shale as an Alternative Source of Energy

    For some years now, the search for alternative sources of raw materials has concentrated on oil shale deposits. As the exploitation of these raw materials is still extremely complex and expensive,…
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  • Science Lab Topic: EM Sample Preparation

    Triple Ion Beam Cutting of Diamond/Al Composites for Interface Characterization

    The microstructure of new materials with heterogenic components is extremely difficult to study. As mechanical polishing often not leads to smooth surfaces, a novel ion beam cutting technique has…
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  • Science Lab Topic: EM Sample Preparation

    A Word on Cathodoluminescence

    Cathodoluminescence microanalysis is an emerging technique that is fast gaining popularity in the world of materials science. CL is a light emission phenomena resulting from the electron beam…
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  • Science Lab Topic: EM Sample Preparation

    University of Wollongong Electron Microscopy Centre

    The University of Wollongong has a diverse range of materials research programs that includes metallurgy for mining, manufacturing, steel making and transport; polymers for solar cells, energy storage…
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