Raj Saini , MSc
Advanced Workflow Specialist UK, Leica Microsystems
MSc Semiconductor Devices-Lancaster University (Brunel, Applied Physics)
Career:
- TI; Chip layout
- Fab (photolithography-Process Engineer)
- BioRad; Overlay Metrology System (photolith-Applications Engineer)
- KLA-Tencor; Metrology and Low-voltage SEM (photolith-Senior Applications Engineer)
- NVS; Process Control Software for Photolith (Applications Manager, Project Manager)
- Malvern Instruments: Analysers (Optical, Raman, NIR: Service Specialist)
- Leica Microsystems (Advanced Workflow Specialist)
6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences
A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…