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Thomas Pfeifer

Thomas Pfeifer

Advanced Workflow Specialist

Before becoming an AWS in January 2020, Thomas worked for 10 years as a Project manager in the R&D department of Leica´s Nanotechnology division. Before joining Leica, he worked as an Application Specialist for Bal-Tec. Thomas holds a degree in Physics from the Technical University of Chemnitz, where he worked as a Research Assistant to the Chair of Physics of Solid Bodies.

Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest.

Structural and Chemical Analysis of IC-Chip Cross Sections

This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS
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