High-resolution microscopy at the touch of a button

Experience high-resolution microscopy at the touch of a button - in close contact with the resolution limit in the microscope

Every little thing counts in the optical inspection of electronic components such as wafers, semiconductors, MEMS, processors and fine-grained structures such as carbides. If you strive for higher microscopy resolution to find the details you are looking for, then get to know the innovative Oblique UV contrast method! Michael Doppler shows how you can see your sample in high resolution and high contrast from any angle - without oil immersion or transfer to REM.

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