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Industrial
Sumérjase en artículos detallados y seminarios web centrados en la inspección eficaz, los flujos de trabajo optimizados y la comodidad ergonómica en contextos industriales y patológicos. Los temas tratados incluyen el control de calidad, el análisis de materiales y la microscopía en patología, entre muchos otros. Este es el lugar donde obtendrá información valiosa sobre el uso de tecnologías de vanguardia para mejorar la precisión y la eficacia de los procesos de fabricación, así como el diagnóstico y la investigación patológicos precisos.
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Rapid Semiconductor Inspection with Microscope Contrast Methods
Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…
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Microscope Resolution: Concepts, Factors and Calculation
This article explains in simple terms microscope resolution concepts, like the Airy disc, Abbe diffraction limit, Rayleigh criterion, and full width half max (FWHM). It also discusses the history.
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A Brief History of Light Microscopy
The history of microscopy begins in the Middle Ages. As far back as the 11th century, plano-convex lenses made of polished beryl were used in the Arab world as reading stones to magnify manuscripts.…
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Applications of TIRF Microscopy in Life Science Research
The special feature of TIRF microscopy is the employment of an evanescent field for fluorophore excitation. Unlike standard widefield fluorescence illumination procedures with arc lamps, LEDs or…
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Total Internal Reflection Fluorescence (TIRF) Microscopy
Total internal reflection fluorescence (TIRF) is a special technique in fluorescence microscopy developed by Daniel Axelrod at the University of Michigan, Ann Arbor in the early 1980s. TIRF microscopy…
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Super-Resolution GSDIM Microscopy
The nanoscopic technique GSDIM (ground state depletion microscopy followed by individual molecule return) provides a detailed image of the spatial arrangement of proteins and other biomolecules within…