インダストリー

インダストリー

インダストリー

産業分野における効率的な検査、最適化されたワークフロー、人間工学に基づく快適性に焦点を当てた詳細な記事やウェビナーをぜひご覧ください。品質管理、材料解析における顕微鏡検査など、幅広いトピックを取り上げています。製造工程の精度と効率を向上させる技術や、最先端技術の活用について、貴重な知見を得ることができます。
Radially grown sugar crystals which have been imaged with a Leica microscope using circular polarized light.

Polarizing Microscope Image Gallery

How polarization microscope images can be used for analysis is shown in this gallery. Polarized light microscopy (also known as polarizing microscopy) is an important method for different fields and…
Documentation of an automotive clutch friction surface with a digital microscope

Automotive Part Verification and Development according to Specifications

Automotive part verification during the development and production of parts and components by suppliers or manufacturers is important for ensuring that specifications are met. Specifications are…
Particles observed on the surface of a particle trap which could be used for technical cleanliness during battery production.

Battery Particle Detection During the Production Process

How battery particle detection and analysis is enhanced with optical microscopy and laser spectroscopy for rapid, reliable, and cost-effective QC during battery production is explained in this…
Particulate contamination in between moving metal plates.

Key Factors for Efficient Cleanliness Analysis

An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…

Quality Control via Cross Sections of PCBs, PCBAs, ICs, and Batteries

Why cross sections of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), and battery components are useful for quality control (QC), failure analysis (FA), and research…
Image of a Siemens star, where the diameter of the 1st black line circle is 10 mm and the 2nd is 20 mm, taken via an eyepiece of a M205 A stereo microscope. The rectangles represent the field of view (FOV) of a Leica digital camera when installed with various C-mounts (red 0.32x, blue 0.5x, green 0.63x).

Understanding Clearly the Magnification of Microscopy

To help users better understand the magnification of microscopy and how to determine the useful range of magnification values for digital microscopes, this article provides helpful guidelines.
Material sample with a large height, size, and weight being observed with an inverted microscope.

Five Inverted-Microscope Advantages for Industrial Applications

With inverted microscopes, you look at samples from below since their optics are placed under the sample, with upright microscopes you look at samples from above. Traditionally, inverted microscopes…
Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest.

Structural and Chemical Analysis of IC-Chip Cross Sections

This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…
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