EM RES102

Archived Product

This item has been phased out and is no longer available. Please contact us to enquire about recent alternative products that may suit your needs.

Thin, clean, polish, cut slopes and structure your samples with the highest level of flexibility in the Leica EM RES102. The unique ion beam milling system combines the preparation of TEM, SEM and LM samples in one single benchtop unit.

A variety of sample holders allows a diverse range of applications to be carried out. In addition to high-energy ion beam milling, the Leica EM RES102 can also be used for very gentle sample processing using low ion energy.

For research use only

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