Michael Doppler is a Senior Advanced Workflow Specialist at Leica Microsystems. He studied Mineralogy and Economic Geology in Heidelberg, Germany and received his Master of Science (MSc) in 1990. From 1990 to 1996 he worked as Scientific Collaborator at the Mineralogy Department of the University of Geneva, Switzerland. He taught mineralogical microscopy classes in both places. Since joining Leica Microsystems in 1996, he has held various sales roles and Application Manager positions in Europe and worldwide. He has carried out numerous microscopy trainings internally and externally for Leica associates, channel partners and customers.
- How to streamline your inspection by working digitally in stand-alone mode without the need for a PC.
- Save time by doing everything from visual inspection to measurement and data sharing within a single system.
- Enhance communication by automatically saving images on your network and easily sharing results with your co-workers.
- Work your own way by combining the Emspira 3 digital microscope with a variety of accessories to fulfill your inspection needs.