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脳神経外科、眼科、形成外科、耳鼻咽喉科、歯科の専門医向けに厳選された、最新の科学・臨床リソースを探索しませんか? 貴重な症例や洞察、シンポジウムなど、多彩なコンテンツをご覧いただけます。 手術用顕微鏡の最先端技術に焦点を当て、AR蛍光、3D視覚化、術中OCTイメージングといった革新的技術が、複雑な手術の精度向上や意思決定の最適化にどのように貢献するかをご紹介します。
SEM image of the full Li-NMC electrode sample, showing the two porous layers and the metal film at the center of the structure.

Revealing Sodium Battery Degradation via Cryo-EM and CryoFIB

Explore how cryogenic electron microscopy and focused ion beam techniques uncover the intrinsic structure of sodium battery interfaces. This webinar presents a new degradation model based on separator…
Documentation of an automotive clutch friction surface with a digital microscope

Automotive Part Verification and Development according to Specifications

Automotive part verification during the development and production of parts and components by suppliers or manufacturers is important for ensuring that specifications are met. Specifications are…
Leitz Laborlux: Tartaric acids, polarization contrast

The Polarization Microscopy Principle

Polarization microscopy is routinely used in the material and earth sciences to identify materials and minerals on the basis of their characteristic refractive properties and colors. In biology,…

Workflow Solutions for Sample Preparation Methods for Material Science

This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.
Particles observed on the surface of a particle trap which could be used for technical cleanliness during battery production.

Battery Particle Detection During the Production Process

How battery particle detection and analysis is enhanced with optical microscopy and laser spectroscopy for rapid, reliable, and cost-effective QC during battery production is explained in this…
Particulate contamination in between moving metal plates.

Key Factors for Efficient Cleanliness Analysis

An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
Microscope equipped with a K7 color CMOS camera for life-science and industry imaging applications.

Technical Terms for Digital Microscope Cameras and Image Analysis

Learn more about the basic principles behind digital microscope camera technologies, how digital cameras work, and take advantage of a reference list of technical terms from this article.
Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…

Quality Control via Cross Sections of PCBs, PCBAs, ICs, and Batteries

Why cross sections of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), and battery components are useful for quality control (QC), failure analysis (FA), and research…
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