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Perusing Alternatives for Automated Staining of TEM Thin Sections
Contrast in transmission electron microscopy (TEM) is mainly produced by electron scattering at the specimen: Structures that strongly scatter electrons are referred to as electron dense and appear as…
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Brief Introduction to Critical Point Drying
One of the uses of the Scanning Electron Microscope (SEM) is in the study of surface morphology in biological applications which requires the preservation of the surface details of a specimen. Samples…