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Science Lab
Bem-vindo ao portal de conhecimento da Leica Microsystems. Você encontrará pesquisas científicas e material didático sobre o tema microscopia. O portal oferece suporte a iniciantes, profissionais experientes e cientistas em seus trabalhos e experimentos diários. Explore tutoriais interativos e notas de aplicação, descubra os fundamentos da microscopia, bem como as tecnologias de ponta. Faça parte da comunidade do Science Lab e compartilhe sua experiência.
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Burr Detection During Battery Manufacturing
See how optical microscopy can be used for burr detection on battery electrodes and determination of damage potential to achieve rapid and reliable quality control during battery manufacturing.
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Cross-section Analysis for Electronics Manufacturing
This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
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Structural and Chemical Analysis of IC-Chip Cross Sections
This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…
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How to Prepare and Analyse Battery Samples with Electron Microscopy
This workshop covers the sample preparation process for lithium and novel battery sample analysis, as well as other semiconductor samples requiring high-resolution cross-section imaging.
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Cross Section Ion Beam Milling of Battery Components
Sample Preparation of Lithium battery systems requires high quality surface preparation to evaluate their internal structure and morphology. Due to the brittle materials involved, preparing pristine…
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Metallography with Color and Contrast
The examination of microstructure morphology plays a decisive role in materials science and failure analysis. There are many possibilities of visualizing the real structures of materials in the light…