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David R. Barbero , PhD

David R. Barbero

Dr. David R. Barbero ist Ingenieur und Physiker und verfügt über mehr als 15 Jahre Erfahrung mit optoelektronischen Materialien, Geräten und Displays im Nanobereich. Seine Arbeiten wurden in mehreren führenden Fachzeitschriften für Materialwissenschaft und Physik veröffentlicht und in über 300 wissenschaftlichen Zeitungen und Internet-Websites vorgestellt. Er verfügt über langjährige Erfahrung in der Nanomusterung und Nanostrukturierung von Polymeren und Verbundwerkstoffen (optische Lithografie, Nanoimprinting, kolloidale Nanoröhren und Polymerselbstorganisation). David promovierte in Physik am Cavendish Laboratory der Universität Cambridge (Vereinigtes Königreich), wo er als Marie-Curie-Stipendiat und European Cambridge Trust Scholar tätig war. 2009 wurde er mit dem Abdus-Salam-Zweitplatzierten-Preis der Universität Cambridge in Physik ausgezeichnet.

Image of burrs (red arrows) at the edge of a battery electrode acquired with a DVM6 digital microscope.

Burr Detection During Battery Manufacturing

See how optical microscopy can be used for burr detection on battery electrodes and determination of damage potential to achieve rapid and reliable quality control during battery manufacturing.
Particles observed on the surface of a particle trap which could be used for technical cleanliness during battery production.

Battery Particle Detection During the Production Process

How battery particle detection and analysis is enhanced with optical microscopy and laser spectroscopy for rapid, reliable, and cost-effective QC during battery production is explained in this…
Particulate contamination in between moving metal plates.

Key Factors for Efficient Cleanliness Analysis

An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection for QC of materials like wafers can be challenging. Microscope solutions that offer several contrast methods enable fast and reliable defect detection and efficient workflows.
Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.

Cross-section Analysis for Electronics Manufacturing

This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
Raw widefield and THUNDER image of transversal mouse adult fiber lens section. Courtesy N. Houssin, Plagemen lab, Ohio State University, Columbus, USA.

Studying Ocular Birth Defects

This article discusses how lens formation and ocular birth defects can be studied with sharp widefield microscopy images which are acquired rapidly. The mouse ocular lens is used as a model to study…
The various solutions from Leica Microsystems for cleanliness analysis.

Factors to Consider for a Cleanliness Analysis Solution

Choosing the right cleanliness analysis solution is important for optimal quality control. This article discusses the important factors that should be taken into account to find the solution that best…
[Translate to German:] Particles and fibers on a filter which will be counted and analyzed for cleanliness

Effiziente Partikelzählung und -analyse

Dieser Bericht befasst sich mit der Partikelzählung und -analyse unter Verwendung der optischen Mikroskopie bei der technischen Sauberkeitsanalyse von Teilen und Komponenten. Die Partikelzählung und…
[Translate to German:] Particles which could be found during cleanliness analysis of parts and components.

Technische Sauberkeit von Automobilkomponenten und -teilen

In diesem Artikel werden die ISO-Norm 16232 und die VDA 19-Richtlinien erläutert und die Verfahren zur Partikelanalyse kurz zusammengefasst. Diese liefern wichtige Kriterien für die Sauberkeit von…
Electronic component

Top Challenges for Visual Inspection

This article discusses the challenges encountered when performing visual inspection and rework using a microscope. Using the right type of microscope and optical setup is paramount in order to…
[Translate to German:]  Routine inspection microscope Ivesta 3

How to select the right solution for visual inspection

This article helps users with the decision-making process when selecting a microscope as a solution for routine visual inspection. Important factors that should be considered are described.

Introduction to 21 CFR Part 11 and Related Regulations

This article provides an overview of regulations and guidelines for electronic records (data entry, storage, signatures, and approvals) used in the USA (21 CFR Part 11), EU (GMP Annex 11), and China…

Why is Manual Visual Inspection of Medical Devices so Challenging?

This article discusses how manual visual inspection, which is prevalent in the medical device industry, can lead to inconsistent results. It also addresses the challenges quality managers and…

Keeping Particulate Contamination Under Control in Pharmaceutical Products

This article describes how a 2-methods-in-1 solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) can be utilized for identification of particulate contaminants in the…

How does an Automated Rating Solution for Steel Inclusions Work?

The rating of non-metallic inclusions (NMIs) to determine steel quality is critical for many industrial applications. For an efficient and cost-effective steel quality evaluation, an automated NMI…

Challenges Faced When Manually Rating Non-Metallic Inclusions (NMIs) to Determine Steel Quality

Rapid, accurate, and reliable rating of non-metallic inclusions (NMIs) is instrumental for the determination of steel quality. This article describes the challenges that arise from manual NMI rating,…

Reasons Why There is Growing Need for Fast and Reliable Steel Quality Rating Solutions

Steel quality is critical for the manufacturing of high-quality components and products. Fast, reliable, and accurate detection and classification of inclusions has become essential for both component…

Top Issues Related to Standards for Rating Non-Metallic Inclusions in Steel

Supplying components and products made of steel to users worldwide can require that a single batch be compliant with multiple steel quality standards. This user demand creates significant challenges…
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