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DM6 M LIBS Material Analysis Microscope

90% time savings: Visual & chemical material inspection 2-in-1

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Particles observed on the surface of a particle trap which could be used for technical cleanliness during battery production.

Battery Particle Detection During the Production Process

How battery particle detection and analysis is enhanced with optical microscopy and laser spectroscopy for rapid, reliable, and cost-effective QC during battery production is explained in this…

Quality Control via Cross Sections of PCBs, PCBAs, ICs, and Batteries

Why cross sections of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), and battery components are useful for quality control (QC), failure analysis (FA), and research…
Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest.

Structural and Chemical Analysis of IC-Chip Cross Sections

This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…
The various solutions from Leica Microsystems for cleanliness analysis.

Factors to Consider for a Cleanliness Analysis Solution

Choosing the right cleanliness analysis solution is important for optimal quality control. This article discusses the important factors that should be taken into account to find the solution that best…
Particles and fibers on a filter which will be counted and analyzed for cleanliness

Efficient Particle Counting and Analysis

This report discusses particle counting and analysis using optical microscopy for cleanliness of parts and components. Particle counting and analysis is a critical part of quality assurance in the…
A stack of lithium-ion batteries

Quality Control Under the Microscope

Fast-rising demand for electric vehicles is one of the market’s main drivers, but there are other hotspots of growth, including the rise in renewable energy installations, such as photovoltaic panels,…
Particles which could be found during cleanliness analysis of parts and components.

Cleanliness of Automotive Components and Parts

This article discusses the ISO 16232 standard and VDA 19 guidelines and briefly summarizes the particle analysis methods. They give important criteria for the cleanliness of automotive parts and…

Keeping Particulate Contamination Under Control in Pharmaceutical Products

This article describes how a 2-methods-in-1 solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) can be utilized for identification of particulate contaminants in the…

Depth Profiling and Layer Analysis for Inspection of Materials with a 2-In-1 Solution Combining Optical Microscopy and Laser Spectroscopy

In addition to simultaneous visual and chemical inspection, a 2-methods-in-1 materials analysis solution, which combines optical microscopy and laser induced breakdown spectroscopy (LIBS), can also be…

Visual and Chemical Analysis of Steel Microstructure: Faster Rating of Steel Quality

Simultaneous visual and chemical analysis of steel non-metallic inclusions with a 2-methods-in-1 solution, using optical microscopy and laser induced breakdown spectroscopy (LIBS), is described in…

See the Structure with Microscopy - Know the Composition with Laser Spectroscopy

The advantages of a 2-in-1 materials analysis solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) for simultaneous visual and chemical inspection are described in…
Microscopy Solutions for Battery Manufacturing

Battery Manufacturing Microscopy Solutions

Battery manufacturing has several key challenges concerning inspection. Solutions for sample preparation and microscopic visual and chemical analysis are needed.

Fields of Application

Metallography

The microstructural analysis of metals, alloys, and other materials can be optimized by taking advantage of a Leica metallographic microscope solution.

Automotive & Aerospace Microscopy Solutions

Discover advanced microscopy solutions from Leica Microsystems for quality control, failure analysis, and innovation in automotive, aerospace, railway, and shipbuilding.

Technical Cleanliness Microscopes

For industrial and electronics manufacturers as well as non-regulated pharma applications, solutions for an efficient technical cleanliness offer significant advantages.

Automated Microscopes

Automated microscopes are very useful for applications which require many repetitious observations over a long period of time. Examples are live-cell imaging or high-throughput analysis for quality…

Industrial Microscopy Markets

Maximizing uptime and achieving targets efficiently help your bottom line. Leica microscope solutions can give you insights into the smallest sample details as well as analyze, document, and report…

Metal Industry Microscopy Solutions

Leica microscope solutions for the metal industry are useful for assessing the quality of materials and ensuring compliance with applicable standards.

Cross-Section Analysis for Electronics

Cross-section analysis for electronics enables detailed analysis of failure mechanisms of components like printed circuit boards (PCBs), assemblies (PCBAs), and integrated circuits (ICs).

Electronics & Semiconductor Industry Microscopy Solutions

For electronics and semiconductors, solutions enabling efficient inspection, cross-section and cleanliness analysis, and R&D of PCBs, wafers, IC chips, and batteries are crucial.

Battery Manufacturing Microscopy Solutions

Battery manufacturing has several key challenges concerning inspection. Solutions for sample preparation and microscopic visual and chemical analysis are needed.

Measurement Microscopes

Measurement microscopes are useful for determining dimensions of sample features. They are key for efficient quality control (QC), failure analysis, and research and development (R&D).

Material Science & Analysis

For materials science & analysis, microscopes play a key role. They are used to analyze metal alloys, ceramics, and polymers for research and quality control.

Popular Configurations

Effective April 7, 2025, Leica Microsystems transactions will apply an adjustment tariff charge due to new U.S. tariffs on all applicable products.
DM6 M LIBS Material Analysis Microscope

DM6 M LIBS Material Analysis Microscope

Use the DM6M fully motorized inspection microscope with all contrasting modes and benefit from the huge magnification range starting at 1.25x for fast sample overview. The light and contast manager adjusts the required settings for each objective and contrast mode fully automatically and so allows easy operation for each user. By the possibility of an instantaneous chemical analysis by laser induced breakdown spectroscopy (LIBS) the user gets all required information direct and on the spot within seconds without the need of further sample preparation or transportation to other devices.

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Product includes
Quantity

DM6 M basic stand, RL/TL, LED, mot. Z

11889193
1

Dust cover for DM4/6

11505168
1

Ground plate with filter magazine

11888100
1

Reflector BF, fixed

11888716
1

Smart Move l²C

11525232
1

Reflector DF

11888740
1

CTR compact XY

11525227
1

LED lamp housing DM6, cable long

11504242
1

Tube HC L2TU 4/5/7, binoc. phototube

11501598
1

Eyepiece HC PLAN s 10x/25 Br. M

11507808
2

Stage insert 160x116x7mm

11532701
1

Glass plate 160x116x3mm; for industrial

11600183
1

Scanning stage mot., DM4-6, 100x100,2mm

11501260
1

Metal insert 160x116 f.Scan.-St.100x80

11532502
1

Cable scanningstage, XY-adv. board

11525218
1

Condenser BF

11505141
1

Condenser head achr. 0.50 S15

11501037
1

Microscope Objective HC PL FLUOTAR 5x/0,15 BD

11566046
1

Microscope Objective HC PL FLUOTAR 10x/0,30 BD

11566503
1

Microscope Objective HC PL FLUOTAR 20x/0,45 BD

11566509
1

Microscope Objective HC PL FLUOTAR 50x/0,80 BD

11566201
1

Microscope Objective HC PL FLUOTAR 100x/0,90 BD

11566203
1

K5C The Color CMOS Camera

11547118
1

C-Mount adapter 1x HC f. 1"

11541510
1

LIBS standard sample

11560204
1

SpectralTools licence

11560205
1

LIBS module, complete

11560200
1

LIBS reflector cube

11561105
1

Microscope Objective 20x/0.40 LIBS NUV

11518149
1

Laser safety set for mot. stage

11560201
1

HP E27k G5 27inches UHD

11533663
1

Silver Workstation

11640714
1

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