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Expert Knowledge on High Pressure Freezing and Freeze Fracturing in the Cryo SEM Workflow
Get an insight in the working methods of the laboratory and learn about the advantages of Cryo SEM investigation in EM Sample Preparation. Find out how high pressure freezing, freeze fracturing and…
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Bridging Structure and Dynamics at the Nanoscale through Optogenetics and Electrical Stimulation
Nanoscale ultrastructural information is typically obtained by means of static imaging of a fixed and processed specimen. However, this is only a snapshot of one moment within a dynamic system in…
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Expanding the Limits of Electron Microscopy Sample Preparation
Capturing the intricate changes in fine structure or in cell dynamics with conventional cryo solutions can be challenging sometimes. Leica Microsystems has developed a new cryo platform, the Leica EM…
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High Resolution Array Tomography with Automated Serial Sectioning
The optimization of high resolution, 3-dimensional (3D), sub-cellular structure analysis with array tomography using an automated serial sectioning solution, achieving a high section density on the…
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Macroscale to Nanoscale Pore Analysis of Shale and Carbonate Rocks
Physical porosity in rocks, like shale and carbonate, has a large effect on the their storage capacity. The pore geometries also affect their permeability. Imaging the visible pore space provides…
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Visualization of DNA Molecules
Precise low angle rotary shadowing with heavy metals (like platinum) can be used in transmission electron microscopy (TEM) to observe molecular details of objects previously absorbed on a thin, low…
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Practical Applications of Broad Ion Beam Milling
Mechanical polishing can be time consuming and frustrating. It can also introduce unwanted artifacts when preparing cross-sectioned samples for electron backscatter diffraction (EBSD) in the scanning…
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Interview with Dr. Shigeki Watanabe on Research in Synaptic Membrane Dynamics
Dr. Shigeki Watanabe, principle investigator of the department of Cell Biology at the Johns Hopkins University School of Medicine in Baltimore, held a workshop in Zürich, Switzerland on methods to…
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Each Atom Counts: Protect Your Samples Prior to FIB Processing
Application Note for Leica EM ACE600 - Focused ion beam (FIB) technology has become an indispensable tool for site-specific TEM sample preparation. It allows to extract electron transparent specimens…