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Bem-vindo ao portal de conhecimento da Leica Microsystems. Você encontrará pesquisas científicas e material didático sobre o tema microscopia. O portal oferece suporte a iniciantes, profissionais experientes e cientistas em seus trabalhos e experimentos diários. Explore tutoriais interativos e notas de aplicação, descubra os fundamentos da microscopia, bem como as tecnologias de ponta. Faça parte da comunidade do Science Lab e compartilhe sua experiência.
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Key Factors for Efficient Cleanliness Analysis
An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
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Rapid Semiconductor Inspection with Microscope Contrast Methods
Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…
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How to perform cross-section analysis for Quality Control of PCBs, PCBAs, ICs and batteries
Cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
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Studying Virus Replication with Fluorescence Microscopy
The results from research on SARS-CoV-2 virus replication kinetics, adaption capabilities, and cytopathology in Vero E6 cells, done with the help of fluorescence microscopy, are described in this…
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Epi-Illumination Fluorescence and Reflection-Contrast Microscopy
This article discusses the development of epi-illumination and reflection contrast for fluorescence microscopy concerning life-science applications. Much was done by the Ploem research group…
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Five Inverted-Microscope Advantages for Industrial Applications
With inverted microscopes, you look at samples from below since their optics are placed under the sample, with upright microscopes you look at samples from above. Traditionally, inverted microscopes…
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ISO 9022 Standard Part 11 - Testing Microscopes with Severe Conditions
This article describes a test to determine the robustness of Leica microscopes to mold and fungus growth. The test follows the specifications of the ISO 9022 part 11 standard for optical instruments.
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High-Quality EBSD Sample Preparation
This article describes a method for EBSD sample preparation of challenging materials. The high-quality samples required for electron backscatter diffraction are prepared with broad ion-beam milling.
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Key Factors to Consider When Selecting a Stereo Microscope
This article explains key factors that help users determine which stereo microscope solution can best meet their needs, depending on the application.