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Science Lab
Bem-vindo ao portal de conhecimento da Leica Microsystems. Você encontrará pesquisas científicas e material didático sobre o tema microscopia. O portal oferece suporte a iniciantes, profissionais experientes e cientistas em seus trabalhos e experimentos diários. Explore tutoriais interativos e notas de aplicação, descubra os fundamentos da microscopia, bem como as tecnologias de ponta. Faça parte da comunidade do Science Lab e compartilhe sua experiência.
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Automatic Alignment of Sample and Knife for High Sectioning Quality
Automatic alignment of sample and knife on the ultramicrotome UC Enuity, enabling even untrained users to create ultrathin sections with reduced risk of losing precious sections.
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Key Factors for Efficient Cleanliness Analysis
An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
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Rapid Semiconductor Inspection with Microscope Contrast Methods
Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…
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Quality Control via Cross Sections of PCBs, PCBAs, ICs, and Batteries
Why cross sections of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), and battery components are useful for quality control (QC), failure analysis (FA), and research…
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Studying Virus Replication with Fluorescence Microscopy
The results from research on SARS-CoV-2 virus replication kinetics, adaption capabilities, and cytopathology in Vero E6 cells, done with the help of fluorescence microscopy, are described in this…
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Epi-Illumination Fluorescence and Reflection-Contrast Microscopy
This article discusses the development of epi-illumination and reflection contrast for fluorescence microscopy concerning life-science applications. Much was done by the Ploem research group…
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Five Inverted-Microscope Advantages for Industrial Applications
With inverted microscopes, you look at samples from below since their optics are placed under the sample, with upright microscopes you look at samples from above. Traditionally, inverted microscopes…
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ISO 9022 Standard Part 11 - Testing Microscopes with Severe Conditions
This article describes a test to determine the robustness of Leica microscopes to mold and fungus growth. The test follows the specifications of the ISO 9022 part 11 standard for optical instruments.
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High-Quality EBSD Sample Preparation
This article describes a method for EBSD sample preparation of challenging materials. The high-quality samples required for electron backscatter diffraction are prepared with broad ion-beam milling.