Microscopic Defects in Electroplating

How to identify root causes of defects during electroplating of components with optical microscopy and LIBS

Optical microscope image of salt contamination on an aluminum/silicon (Al/Si) surface. Credit: Gerweck GmbH, Germany. Electroplating_LIBS_on-dema.jpg

About the webinar

During electroplating, contamination, residues, or inclusions can quickly lead to a noticeable reduction in product quality or even failure of full batches. Similar types of contamination or defects can be found in production environments of the electronics and automotive industries.

In this webinar, it will be presented how Laser Induced Breakdown Spectroscopy (LIBS) is used in quality control to identify quickly the root cause of defects (contamination) during electroplating of products. Using typical examples from the field, it will be shown how these samples can be investigated with a 2-in1-solution combining optical microscopy and LIBS for visual and chemical analysis of materials.

What to expect in the webinar

Key learnings

  • Find out more about typical surface defects which occur during electroplating of electronics
  • Learn how typical defects or contamination can be quickly and efficiently analyzed using a 2-in1-solution for visual and chemical analysis
  • Understand how to use LIBS (laser induced breakdown spectroscopy) to identify the root cause of contamination or defects

The Speakers

Hans-Ullrich Eckert

Head of Development, Gerweck GmbH

Hans-Ullrich Eckert is Head of Development process technology at Gerweck GmbH Surface technology in Bretten, Germany. Gerweck GmbH is the leading provider of electroplating of electronic and technical devices, especially for selective reel-to-reel plating, and uses the Leica two-in-one microscope and LIBS system for their sample analysis. Hans-Ullrich has 40 years of professional experience in the field of electroplating. Besides his master's qualification in electroplating, he also holds a Master of Business Administration and is a member of the examination committee of the Chamber of Commerce Karlsruhe.

Dr. Konstantin Kartaschew

Konstantin Kartaschew is an Advanced Workflow Specialist at Leica Microsystems

He holds a PhD in physical chemistry from the Ruhr University Bochum (Germany), with a focus on micro-spectroscopic analysis. After his PhD he broadened his experience, as a product specialist for spectroscopy within several molecular and elemental spectroscopy (e.g. atomic emission and X-ray fluorescence spectroscopy) methods. In 2019 he joined Leica Microsystems as a specialist in LIBS (Laser-induced Breakdown Spectroscopy) and further specific compound microscopy applications. Konstantin’s role give him the opportunity to exchange with customers in different industries. Learning about their challenges and offering them practical advice gives him great job satisfaction.

See the webinar

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