Science Lab

Science Lab

Science Lab

The knowledge portal of Leica Microsystems offers scientific research and teaching material on the subjects of microscopy. The content is designed to support beginners, experienced practitioners and scientists alike in their everyday work and experiments. Explore interactive tutorials and application notes, discover the basics of microscopy as well as high-end technologies – become part of the Science Lab community and share your expertise!
User analyzing particles and fibers on a filter for cleanliness analysis with the DM6 M LIBS 2-methods-in-1 solution.

Basics in Component Cleanliness Analysis

An overview on the basics of component cleanliness and analysis solutions that can be tailored to your specific needs is presented. For the automotive industry, obtaining results rapidly, accurately,…

Cleanliness Analysis with a 2-Methods-in-1 Solution

In this article, it is examined how an overall efficient and cost-effective cleanliness analysis workflow can be achieved with a 2-methods-in-1 materials analysis solution, combining optical…
The various solutions from Leica Microsystems for cleanliness analysis.

Factors to Consider for a Cleanliness Analysis Solution

Choosing the right cleanliness analysis solution is important for optimal quality control. This article discusses the important factors that should be taken into account to find the solution that best…
Type of contamination: spores

Cleanliness Analysis for Particulate Contamination

Devices, products, and their components fabricated in many industries can be quite sensitive to contamination and, as a result, have stringent requirements for technical cleanliness. Measurement…
Electronic component

Top Challenges for Visual Inspection

This article discusses the challenges encountered when performing visual inspection and rework using a microscope. Using the right type of microscope and optical setup is paramount in order to…
Particle analysis with LIBS using the DM6 M LIBS 2-in-1 solution: Particle of brass, an alloy of copper (Cu) and zinc (Zn).

High Speed for Your Material Analysis Workflow

Learn from our expert, Dr. Konstantin Kartaschew, how the intelligent combination of light microscopy with laser-induced breakdown spectroscopy (LIBS) will truly accelerate your root-cause-analysis…
Wafer

How to Boost your Microelectronic Component Inspection Performance

Do you need to see more when inspecting silicon wafers or MEMS? Would you like to get sharp and detailed sample images which are similar to those from electron microscopes? Watch this free webinar…

How to select the right solution for visual inspection

This article helps users with the decision-making process when selecting a microscope as a solution for routine visual inspection. Important factors that should be considered are described.

How to Use a Digital Microscope to Streamline Inspection Processes

Watch this webinar for inspiration and expert advice on how to make quality control simpler, quicker, and easier. Learn how to perform comprehensive visual inspection, including comparison,…
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