Science Lab

The knowledge portal of Leica Microsystems offers scientific research and teaching material on the subjects of microscopy. The content is designed to support beginners, experienced practitioners and scientists alike in their everyday work and experiments. Explore interactive tutorials and application notes, discover the basics of microscopy as well as high-end technologies – become part of the Science Lab community and share your expertise!

Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.

Cross-section Analysis for Electronics Manufacturing

Cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc. are described in this…

Material sample with a large height, size, and weight being observed with an inverted microscope.

Five Inverted-Microscope Advantages for Industrial Applications

With inverted microscopes, you look at samples from below since their optics are placed under the sample, with upright microscopes you look at samples from above. Traditionally, inverted microscopes…

Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest.

Structural and Chemical Analysis of IC-Chip Cross Sections

This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…

Electric car or EV car charging in station. Eco-friendly alternative energy concept.

Alternative Fuels and Why Sustainable Solutions are Important

This free on-demand webinar is about the role of alternative fuel vehicles and why sustainable solutions are of increasing importance to the automotive industry.

Technical Cleanliness in the Automotive Industry for Electromobility

This free on-demand webinar covers the increasing focus on technical cleanliness in the automotive industry for electromobility and the VDA 19.1 revision.

Optical microscope image of salt contamination on an aluminum/silicon (Al/Si) surface. Credit: Gerweck GmbH, Germany.

Microscopic Defects in Electroplating

This free on-demand webinar shows how to identify quickly root causes of defects during electroplating of components with optical microscopy and LIBS (laser spectroscopy).

User analyzing particles and fibers on a filter for cleanliness analysis with the DM6 M LIBS 2-methods-in-1 solution.

Basics in Component Cleanliness Analysis

An overview on the basics of component cleanliness and analysis solutions that can be tailored to your specific needs is presented. For the automotive industry, obtaining results rapidly, accurately,…

3 Factors Determine the Damage Potential of Particles

This article discusses the 3 factors for determining the potential of a particle to cause damage to parts and components in the automotive and electronic industry. These factors include the…

Cleanliness Analysis with a 2-Methods-in-1 Solution

In this article, it is examined how an overall efficient and cost-effective cleanliness analysis workflow can be achieved with a 2-methods-in-1 materials analysis solution, combining optical…