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Science Lab

Science Lab

Science Lab

The knowledge portal of Leica Microsystems offers scientific research and teaching material on the subjects of microscopy. The content is designed to support beginners, experienced practitioners and scientists alike in their everyday work and experiments. Explore interactive tutorials and application notes, discover the basics of microscopy as well as high-end technologies – become part of the Science Lab community and share your expertise!
Particulate contamination in between moving metal plates.

Key Factors for Efficient Cleanliness Analysis

An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection for QC of materials like wafers can be challenging. Microscope solutions that offer several contrast methods enable fast and reliable defect detection and efficient workflows.
Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.

Cross-section Analysis for Electronics Manufacturing

This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest.

Structural and Chemical Analysis of IC-Chip Cross Sections

This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS
Stereo microscopes are often considered the workhorses of laboratories and production sites.

Key Factors to Consider When Selecting a Stereo Microscope

This article explains key factors that help users determine which stereo microscope solution can best meet their needs, depending on the application.

Rapid and Reliable Examination of PCBs & PCBAs with Digital Microscopy

Digital microscopes provide users with a convenient and rapid way to acquire high-quality, reliable image data and make quick inspection and analysis of printed circuit boards (PCBs) and assemblies…
The principle of the FusionOptics technology:  Of the two separate beam paths (1), one provides depth of field (2) and the other high resolution (3). In the brain, the two images of the sample are merged into a single, optimal 3D image (4).

What is the FusionOptics Technology?

Leica stereo microscopes with FusionOptics provide optimal 3D perception. The brain merges two images, one with large depth of field and the other with high resolution, into one 3D image.
The Emspira 3 digital microscope offers what users need for comprehensive visual inspection, including comparison, measurement, and documentation sharing.

Digital Inspection Microscope for Industrial Applications

Factors users should consider before choosing a digital inspection microscope for industrial applications, including quality control (QC), failure analysis (FA), and R&D, are described in this…
Inspection microscope image of a printed circuit board (PCB) taken with a ring light (RL) and near vertical illumination (NVI).

Microscope Illumination for Industrial Applications

Inspection microscope users can obtain information from this article which helps them choose the optimal microscope illumination or lighting system for inspection of parts or components.
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