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Advancing Cellular Ultrastructure Research
Freeze-fracture and freeze-etching are useful tools for studying flexible membrane-associated structures such as tight junctions or the enteric…
Oct 04, 2021Webinar - Loading...
Introduction to Ion Beam Etching with the EM TIC 3X
In this article you can learn how to optimize the preparation quality of your samples by using the ion beam etching method with the EM TIC 3X ion beam…
May 11, 2020Tutorial - Loading...
Visual and Chemical Analysis of Steel Microstructure: Faster Rating of Steel Quality
Simultaneous visual and chemical analysis of steel non-metallic inclusions with a 2-methods-in-1 solution, using optical microscopy and laser induced…
May 06, 2020Story - Loading...
Brief Introduction to Surface Metrology
This report briefly discusses several important metrology techniques and standard definitions commonly used to assess the topography of surfaces, also…
Nov 06, 2019Tutorial - Loading...
3-Dimensional Imaging of Macroscopic Defects in Aluminum Alloys
The investigation of macroscale defects in aluminum (Al) alloys with a rapid 3-dimensional (3D) imaging approach is described in this report. Aluminum…
Oct 17, 2019Story - Loading...
Studying the Microstructure of Natural Polymers in Fine Detail
The potential of cryogenic broad ion beam milling used in combination with scanning electron microscopy (cryo-BIB-SEM) for imaging and analyzing the…
Oct 16, 2019Story - Loading...
Expert Knowledge on High Pressure Freezing and Freeze Fracturing in the Cryo SEM Workflow
Get an insight in the working methods of the laboratory and learn about the advantages of Cryo SEM investigation in EM Sample Preparation. Find out…
May 23, 2019Story - Loading...
High Resolution Array Tomography with Automated Serial Sectioning
The optimization of high resolution, 3-dimensional (3D), sub-cellular structure analysis with array tomography using an automated serial sectioning…
Oct 14, 2018Story - Loading...
Macroscale to Nanoscale Pore Analysis of Shale and Carbonate Rocks
Physical porosity in rocks, like shale and carbonate, has a large effect on the their storage capacity. The pore geometries also affect their…
Sep 04, 2018Story - Loading...
Contrast Enhancement of Polycrystalline Metals - Sample Preparation for SEM
Application Note - Ion milling is a perfect alternative for chemical etching, especially for polycrystalline metals, such as copper. Ion milling can…
Feb 01, 2017Story - Loading...
Drosophila larvae - Sample Preparation for Cryo-SEM
Application Note for Leica EM ACE900 - Drosophila larvae were sandwiched between two 3 mm aluminum slit carriers with the 100 μm cavities facing each…
Jan 30, 2017Story - Loading...
Porous Ceramics - Sample Preparation for SEM
Application Note for Leica EM RES102 - Ceramic membrane filters with pore sizes down to a few nanometres must be investigated in cross-section with…
Jan 17, 2017Story - Loading...
Removal of Surface Layers - Sample Preparation for SEM and TEM
Application Note for Leica EM RES102 - Sometimes it is necessary to remove surface layers to gain access to the real surface structure. That can be a…
Jan 11, 2017Story - Loading...
Cross Sectioning of a Multilayer System - Preparation of a Perfect Sample Surface for EBSD
Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern…
Dec 22, 2016Story - Loading...
Tobacco Leaf - Critical Point Drying Protocol for SEM
Application Note for Leica EM CPD300 - Critical point drying of tobacco leafs with subsequent platinum coating and SEM analysis.
Nov 18, 2016Story - Loading...
Paper Samples - Sample Preparation for SEM
Application Note for Leica EM RES102 - A coated paper sample has been prepared with ion beam slope cutting in order to test the procedure with regard…
Nov 16, 2016Story - Loading...
Nematode E. dianae - Critical Point Drying Protocol for SEM
Application Note for Leica EM CPD300 - Critical point drying of nematode Eubostrichus dianae to detect the ectosymbiotic bacteria layer with…
Nov 16, 2016Story - Loading...
Contrast Enhancement of Polished Cross Sections of Semiconductor Structures - Sample Preparation for SEM
Application Note for Leica EM RES102 - The surfaces of polished cross sections often show fine scratches and residues of the removed material or of…
Oct 28, 2016Story