![Science Lab](/fileadmin/_processed_/6/0/csm_lms-sl-header_d2c38d8093.jpg)
Science Lab
Science Lab
The knowledge portal of Leica Microsystems offers scientific research and teaching material on the subjects of microscopy. The content is designed to support beginners, experienced practitioners and scientists alike in their everyday work and experiments. Explore interactive tutorials and application notes, discover the basics of microscopy as well as high-end technologies – become part of the Science Lab community and share your expertise!
Filter articles
Tags
Products
Loading...
![Particles observed on the surface of a particle trap which could be used for technical cleanliness during battery production. Particles observed on the surface of a particle trap which could be used for technical cleanliness during battery production.](/fileadmin/_processed_/4/9/csm_Particles_on_the_surface_of_a_particle_trap_72027082ef.jpg)
Battery Particle Detection During the Production Process
How battery particle detection and analysis is enhanced with optical microscopy and laser spectroscopy for rapid, reliable, and cost-effective QC during battery production is explained in this…
Loading...
![Preparation of an IC-chip cross section: grinding and polishing of the chip cross section. Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.](/fileadmin/_processed_/3/b/csm_Grinding_polishing_EM_TXP_91d5c1584d.jpg)
Cross-section Analysis for Electronics Manufacturing
This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
Loading...
![Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest. Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest.](/fileadmin/_processed_/a/c/csm_IC_chip_cross_section_20a5502a5d.jpg)
Structural and Chemical Analysis of IC-Chip Cross Sections
This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…
Loading...
![Optical microscope image of salt contamination on an aluminum/silicon (Al/Si) surface. Credit: Gerweck GmbH, Germany. Optical microscope image of salt contamination on an aluminum/silicon (Al/Si) surface. Credit: Gerweck GmbH, Germany.](/fileadmin/_processed_/0/5/csm_Electroplating_LIBS_on-dema_b37d50e1af.jpg)
Microscopic Defects in Electroplating
This free on-demand webinar shows how to identify quickly root causes of defects during electroplating of components with optical microscopy and LIBS (laser spectroscopy).
Loading...
![The various solutions from Leica Microsystems for cleanliness analysis.](/fileadmin/_processed_/e/c/csm_Particles_metal_cleanliness_53fe3fc5cc.jpg)
Factors to Consider for a Cleanliness Analysis Solution
Choosing the right cleanliness analysis solution is important for optimal quality control. This article discusses the important factors that should be taken into account to find the solution that best…
Loading...
![Particles and fibers on a filter which will be counted and analyzed for cleanliness Particles and fibers on a filter which will be counted and analyzed for cleanliness](/fileadmin/academy/2022/Efficient_particle_counting_and_analysis/Particles_and_fibers_on_a_filter.jpg)
Efficient Particle Counting and Analysis
This report discusses particle counting and analysis using optical microscopy for cleanliness of parts and components. Particle counting and analysis is a critical part of quality assurance in the…
Loading...
![A stack of lithium-ion batteries A stack of lithium-ion batteries](/fileadmin/_processed_/7/3/csm_AdobeStock_136112421_cmyk_edited_84fc3efe2b.jpg)
Quality Control Under the Microscope
Fast-rising demand for electric vehicles is one of the market’s main drivers, but there are other hotspots of growth, including the rise in renewable energy installations, such as photovoltaic panels,…
Loading...
![When particulate contamination is present in lubricating fluids or oils, it can cause damage to parts or components leading to malfunctions. When particulate contamination is present in lubricating fluids or oils, it can cause damage to parts or components leading to malfunctions.](/fileadmin/_processed_/6/2/csm_Particulate_contamination_in_oils_e9abadcc3a.jpg)
Hydraulics in the Automotive and Aerospace Industries
Cleanliness standards relating to lubricants, hydraulic fluids, and oils, e.g., ISO 4406 and DIN 51455 are discussed in this article. Cleanliness plays a central role in the automotive and…
Loading...
![Particles which could be found during cleanliness analysis of parts and components. Particles which could be found during cleanliness analysis of parts and components.](/fileadmin/_processed_/8/f/csm_Particles_found_during_cleanliness_analysis_b09473be0e.jpg)
Cleanliness of Automotive Components and Parts
This article discusses the ISO 16232 standard and VDA 19 guidelines and briefly summarizes the particle analysis methods. They give important criteria for the cleanliness of automotive parts and…