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Science Lab
Bienvenido al portal de conocimiento de Leica Microsystems. Aquí encontrará investigación científica y material didáctico sobre el tema de la microscopía. El portal ayuda a principiantes, profesionales experimentados y científicos por igual en su trabajo diario y en sus experimentos. Explore tutoriales interactivos y notas de aplicación, descubra los fundamentos de la microscopía, así como las tecnologías de gama alta. Forme parte de la comunidad Science Lab y comparta sus conocimientos.
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Burr Detection During Battery Manufacturing
See how optical microscopy can be used for burr detection on battery electrodes and determination of damage potential to achieve rapid and reliable quality control during battery manufacturing.
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Cross-section Analysis for Electronics Manufacturing
This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
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Structural and Chemical Analysis of IC-Chip Cross Sections
This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…
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How to Prepare and Analyse Battery Samples with Electron Microscopy
This workshop covers the sample preparation process for lithium and novel battery sample analysis, as well as other semiconductor samples requiring high-resolution cross-section imaging.
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Cross Section Ion Beam Milling of Battery Components
Sample Preparation of Lithium battery systems requires high quality surface preparation to evaluate their internal structure and morphology. Due to the brittle materials involved, preparing pristine…
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Metallography with Color and Contrast
The examination of microstructure morphology plays a decisive role in materials science and failure analysis. There are many possibilities of visualizing the real structures of materials in the light…