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Science Lab

Science Lab

Bienvenido al portal de conocimiento de Leica Microsystems. Aquí encontrará investigación científica y material didáctico sobre el tema de la microscopía. El portal ayuda a principiantes, profesionales experimentados y científicos por igual en su trabajo diario y en sus experimentos. Explore tutoriales interactivos y notas de aplicación, descubra los fundamentos de la microscopía, así como las tecnologías de gama alta. Forme parte de la comunidad Science Lab y comparta sus conocimientos.

Image of burrs (red arrows) at the edge of a battery electrode acquired with a DVM6 digital microscope.

Burr Detection During Battery Manufacturing

See how optical microscopy can be used for burr detection on battery electrodes and determination of damage potential to achieve rapid and reliable quality control during battery manufacturing.

Particles observed on the surface of a particle trap which could be used for technical cleanliness during battery production.

Battery Particle Detection During the Production Process

How battery particle detection and analysis is enhanced with optical microscopy and laser spectroscopy for rapid, reliable, and cost-effective QC during battery production is explained in this…

Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.

Cross-section Analysis for Electronics Manufacturing

This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.

Rapid and Reliable Examination of PCBs & PCBAs with Digital Microscopy

Digital microscopes provide users with a convenient and rapid way to acquire high-quality, reliable image data and make quick inspection and analysis of printed circuit boards (PCBs) and assemblies…