is mobile? false
Science Lab
Science Lab
Benvenuti nel portale delle conoscenze di Leica Microsystems. Troverete materiale didattico e di ricerca scientifica sul tema della microscopia. Il portale supporta i principianti, i professionisti esperti e gli scienziati nel loro lavoro quotidiano e negli esperimenti. Esplorate i tutorial interattivi e le note applicative, scoprite le basi della microscopia e le tecnologie di punta. Entrate a far parte della comunità di Science Lab e condividete la vostra esperienza.
Il portale informativo Show subnavigation
Seleziona il tuo campo di applicazione Show subnavigation
Filter articles
Tag
Story Type
Products
Loading...

Molecular Biology Analysis facilitated with Laser Microdissection (LMD)
Extracting biomolecules, proteins, nucleic acids, lipids, and chromosomes, as well as extracting and manipulating cells and tissues with laser microdissection (LMD) enables insights to be gained into…
Loading...

Neuron Isolation in Spatial Context with Laser Microdissection (LMD)
After Alzheimer’s disease, Parkinson’s is the second most common progressive neurodegenerative disease. Before the first symptoms manifest, up to 70% of dopamine-releasing neurons in the mid-brain…
Loading...

6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences
A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…
Loading...

Workflow Solutions for Sample Preparation Methods for Material Science
This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.
Loading...

Automatic Alignment of Sample and Knife for High Sectioning Quality
Automatic alignment of sample and knife on the ultramicrotome UC Enuity, enabling even untrained users to create ultrathin sections with reduced risk of losing precious sections.
Loading...

Key Factors for Efficient Cleanliness Analysis
An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
Loading...

Rapid Semiconductor Inspection with Microscope Contrast Methods
Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…
Loading...

Cross-section Analysis for Electronics Manufacturing
This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
Loading...

Studying Virus Replication with Fluorescence Microscopy
The results from research on SARS-CoV-2 virus replication kinetics, adaption capabilities, and cytopathology in Vero E6 cells, done with the help of fluorescence microscopy, are described in this…