Science Lab

Science Lab

Science Lab

Benvenuti nel portale delle conoscenze di Leica Microsystems. Troverete materiale didattico e di ricerca scientifica sul tema della microscopia. Il portale supporta i principianti, i professionisti esperti e gli scienziati nel loro lavoro quotidiano e negli esperimenti. Esplorate i tutorial interattivi e le note applicative, scoprite le basi della microscopia e le tecnologie di punta. Entrate a far parte della comunità di Science Lab e condividete la vostra esperienza.
Particle analysis with the Visoria M microscope

AI-Based Particle Counting with the Aivaro AI Feature Detection Software Module

The Aivaro AI Feature Detection software module enables fast manual microscope inspection of particulate contamination on various material samples. By training different classes, reflective particles,…
AI-based inspection detects, classifies, and measures defects directly in microscope images of components.

AI Image Analysis for Reliable Defect Detection

AI-based visual inspection with microscopy helps make quality control in industrial environments efficient by reducing manual inspection effort concerning defect detection, classification, and…
Overview of Artificial Intelligence (AI) and Machine Learning

An Overview of Artificial Intelligence (AI) and Machine Learning

AI is rapidly changing industrial inspection, quality control, and manufacturing workflows. But not all AI technologies work the same way. From machine learning and deep learning to the newer concept…
Why the Future of Microscopic Inspection Is AI-Assisted, Not Fully Automated

Why the Future of Microscopic Inspection Is AI-Assisted, Not Fully Automated

The next wave of QC productivity gains will not come from building more automated inspection lines. Instead, it will come from augmenting millions of inspection decisions that are made manually every…
Quality assurance during production in a manufacturing plant.

Quality Assurance Improvement Across Industries

Precision is paramount. Imagine a pacemaker that fails mid-operation or a semiconductor flaw that causes a critical system crash. In industries, such as medical devices, electronics, and…
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