Science Lab

Benvenuti nel portale delle conoscenze di Leica Microsystems. Troverete materiale didattico e di ricerca scientifica sul tema della microscopia. Il portale supporta i principianti, i professionisti esperti e gli scienziati nel loro lavoro quotidiano e negli esperimenti. Esplorate i tutorial interattivi e le note applicative, scoprite le basi della microscopia e le tecnologie di punta. Entrate a far parte della comunità di Science Lab e condividete la vostra esperienza.

AI-based inspection detects, classifies, and measures defects directly in microscope images of components.

AI Image Analysis for Reliable Defect Detection

AI-based visual inspection with microscopy helps make quality control in industrial environments efficient by reducing manual inspection effort concerning defect detection, classification, and…

An Overview of Artificial Intelligence (AI) and Machine Learning

AI is rapidly changing industrial inspection, quality control, and manufacturing workflows. But not all AI technologies work the same way. From machine learning and deep learning to the newer concept…

Why the Future of Microscopic Inspection Is AI-Assisted, Not Fully Automated

The next wave of QC productivity gains will not come from building more automated inspection lines. Instead, it will come from augmenting millions of inspection decisions that are made manually every…

Image of glass with primary corundum having numerous inclusions. It was taken with a microscope using polarization contrast.

Ensuring Glass Quality with the Polarization Microscopy Advantage

Glass is one of the oldest materials known. Today, it is used for many applications, e.g., optical instruments, windows, doors, solar panels, containers for food, beverages, and medicine, so strict…

Optical microscope image, which is a composition of both brightfield and fluorescence illumination, showing organic contamination on a wafer surface. The inset images in the upper left corner show the brightfield image (above) and fluorescence image (below with dark background).

Visualizing Photoresist Residue and Organic Contamination on Wafers

As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…

Safe Wafer Loading for Microscope Inspection without Hand Contact

How automated silicon wafer loading for microscope inspection helps improve microelectronics process control and production efficiency is explained in this article. Manual handling of wafers has a…

Image of burrs (red arrows) at the edge of a battery electrode acquired with a DVM6 digital microscope.

Burr Detection During Battery Manufacturing

See how optical microscopy can be used for burr detection on battery electrodes and determination of damage potential to achieve rapid and reliable quality control during battery manufacturing.

Quality assurance during production in a manufacturing plant.

Quality Assurance Improvement Across Industries

Precision is paramount. Imagine a pacemaker that fails mid-operation or a semiconductor flaw that causes a critical system crash. In industries, such as medical devices, electronics, and…

Radially grown sugar crystals which have been imaged with a Leica microscope using circular polarized light.

Polarizing Microscope Image Gallery

How polarization microscope images can be used for analysis is shown in this gallery. Polarized light microscopy (also known as polarizing microscopy) is an important method for different fields and…

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