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Leica EM TIC 3X Ion Beam Milling Leica Leica Microsystems

Ion Beam Milling System Leica EM TIC 3X

  • Sample Preparation for Materials Science

    Sample Preparation for Materials Science

    Sample preparation is key for observing the finest textures and details on the sample surface in high resolution. The right workflow and tools for the pre-preparation will lead to an excellently prepared sample, reduce procedure time and produce reliable and precise results.
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  • Free Webinar-on-Demand: Mechanical pre-preparation and ion milling for SEM observation
    Science Lab Topic: EM Sample Preparation

    Free Webinar-on-Demand: Mechanical pre-preparation and ion milling for SEM observation

    See how the unique combination of pre-preparation system and ion milling system makes fast site specific sample preparation for Scanning Electron Microscopy or optical microscopy possible.
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  • Free Webinar On-Demand: Practical Applications of Broad Ion Beam Milling
    Science Lab Topic: EM Sample Preparation

    Free Webinar On-Demand: Practical Applications of Broad Ion Beam Milling

    Mechanical polishing can be time consuming and frustrating. It can also introduce unwanted artifacts when preparing cross-sectioned samples for electron backscatter diffraction (EBSD) in the scanning electron microscope (SEM) or light microscope investigation. In contrast, ion beam milling can eliminate undesirable artifacts that will hamper your analysis and interpretation.
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  • Cross Sectioning of Cadmiumsulphide (CdS) for Cathodoluminescence
    Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Cadmiumsulphide (CdS) for Cathodoluminescence

    Cathodoluminescence can be used to achieve spectra and high resolution images of impurity and structural defects in semicondoctors, minerals and insulating materials. This application note explains how to prepare a perfect sample surface for carhodoluminescence and how to use ion beam slope cutting to prepare the sample surface free of any preparation artefacts.
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  • Cross Sectioning of Copper for Electron Backscattered Diffraction (EBSD)
    Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Copper for Electron Backscattered Diffraction (EBSD)

    Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating diffraction patterns (Kikuchi-bands). It can be used for crystal orientation mapping, defect studies, phase identification, grain boundary studies and morphological studies. The information depth is just a few nm, therefore good sample preparation is very important to avoid damages.
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  • Cross Section of Solar Cells
    Science Lab Topic: EM Sample Preparation

    Cross Section of Solar Cells

    Application Note for Leica EM TIC020, Leica EM TIC 3X - Cross section of a complete solar cell.
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  • Cross Sectioning of a Multilayer System - Preparation of a Perfect Sample Surface for EBSD
    Science Lab Topic: EM Sample Preparation

    Cross Sectioning of a Multilayer System - Preparation of a Perfect Sample Surface for EBSD

    Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern (Kikuchi-bands). It can be used for crystal orientation mapping, defect studies, phase identification, grain boundary studies and morphology studies. The information depth is just a few nm. Therefore good sample preparation is very important to avoid any damage. This is very difficult in case of multilayer system with big differences in hardness.
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  • Cross Sectioning of Ni/Cu on Steel for EBSD
    Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Ni/Cu on Steel for EBSD

    Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern (Kikuchi-bands). It can be used for crystal orientation mapping, defect studies, phase identification, grain boundary studies and morphology studies. The information depth is just a few nm. Therefore a good sample preparation is very important.
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  • Cross Sectioning of Painted Concrete
    Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Painted Concrete

    Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve flat cuts of material combinations consisting of hard and soft materials. Here, cross sectioning of painted concrete is describes in order to visualize the interface between paint and concrete.
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  • Cross Sectioning of a Superconductive Wire
    Science Lab Topic: EM Sample Preparation

    Cross Sectioning of a Superconductive Wire

    Application Note for Leica EM TIC 3X - Purpose: The shape of the wire is difficult for ion beam slope cutting. Goal: Cross sectional preparation to see the structure of the wire.
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  • Cross Section of an Aluminium Sample for Electron Backscattered Diffraction (EBSD)
    Science Lab Topic: EM Sample Preparation

    Cross Section of an Aluminium Sample for Electron Backscattered Diffraction (EBSD)

    Application Note for Leica EM TIC020, Leica EM TIC 3X - Electron backscattered diffraction (EBSD) is for example used to examine the crystallographic orientation of material. The sample preparation for such samples is sometimes very tricky as the depth of information is just few nm (~20nm or less). That means the sample surface must be flat and free of preparation artefacts. Mechanical polishing leads mostly to sample surfaces damages.
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  • Cross Sectioning of Alumina
    Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Alumina

    Application Note for Leica EM TIC 3X - Alumina is very difficult to handle and almost impossible to prepare with conventional methods. Ion beam slope cutting is a method that can achieve cross sections of material combinations consisting of hard and soft components.
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  • Cross Sectioning of CuSn Connector of a Solar Cell
    Science Lab Topic: EM Sample Preparation

    Cross Sectioning of CuSn Connector of a Solar Cell

    Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve flat cross sections of soft materials or material combinations consisting of hard and soft components. The CuSn connector is very soft. Mechanical polishing leads to smearing.
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  • Cross Sectioning of Oil Shale Rock
    Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Oil Shale Rock

    Application Note for Leica TIC 3X - High quality sample preparation of large area to investigate the sample in the SEM. For the mechanical preparation step diamond lapping foils of 9μm subsequently 2μm and finally 0.5μm grain size were used. It took about 1.5 hours. The sample was removed from the stub with a razor blade after TXP processing and fixed onto the holder of the rotary stage of the Leica EM TIC 3X.
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  • Cross Sectioning of Rubber (Tire)
    Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Rubber (Tire)

    Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve cross sections of soft materials or material combinations consisting of hard and soft components.
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  • Cross Sectioning of Basalt Fibres
    Science Lab Topic: EM Sample Preparation

    Cross Sectioning of Basalt Fibres

    Application Note for Leica EM TIC 3X - Material Research. Purpose: The fibres are embedded in a soft matrix. That makes it difficult to prepare a cross section. Goal: Cross section of the basalt fibres.
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  • Triple-beam Ar-Ion-Milling with a Rotary Stage to Decorate Grain Boundaries and Substructures in Rock Salt
    Science Lab Topic: EM Sample Preparation

    Triple-beam Ar-Ion-Milling with a Rotary Stage to Decorate Grain Boundaries and Substructures in Rock Salt

    Decoration of grain boundaries in polycrystalline rocks has a long tradition in Structural Geology as in a monomineralic rock the recrystallized grain size is a good indicator for the paleostress conditions. Understanding the mechanical properties of rock salt and its deformation behavior is of major importance for the prediction of long-term stability of nuclear waste repositories, and our understanding of the dynamics of salt-related sedimentary basins which host the majority of oil and gas accumulations on Earth.
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  • Electron Microscopy Sample Preparation: “The Future is Cold, Dynamic and Hybrid”
    Science Lab Topic: EM Sample Preparation

    Electron Microscopy Sample Preparation: “The Future is Cold, Dynamic and Hybrid”

    In 2014, the renowned Electron Microscopy for Materials Science (EMAT) research lab at the University Antwerp, Belgium, and Leica Microsystems started a fruitful collaboration to establish a Leica Reference Site in Antwerp. This site, officially opened in July 2014, is dedicated to specimen preparation for electron microscopy in materials science with a special focus on ion beam milling and recently also on carbon coating. In this interview Prof Gustaf van Tendeloo, Director of EMAT, and Frédéric Leroux, TEM specimen preparation specialist, talk about research topics at EMAT, how the Leica reference site has evolved, and future trends for EM sample preparation.
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  • A Good Place for Materials Scientists and Mineralogists to prepare their EM Samples
    Science Lab Topic: EM Sample Preparation

    A Good Place for Materials Scientists and Mineralogists to prepare their EM Samples

    In June 2014, the Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie (IMPMC) of the Université Pierre et Marie Curie in Paris became a Leica reference lab for EM Sample Preparation with equipment like the Leica EM TXP target surfacing systems and the Leica EM TIC 3X ion beam milling system. In the interview, Imène Estève, engineer at the Centre National de Recherches Scientifiques (CNRS) and head of the SEM-FIB national facility, in charge of running the lab, tells us about how this cooperation has developed.
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  • High Quality Sample Preparation for EBSD Analysis by Broad Ion Beam Milling
    Science Lab Topic: EM Sample Preparation

    High Quality Sample Preparation for EBSD Analysis by Broad Ion Beam Milling

    Electron Backscatter Diffraction technique (EBSD) is known as a "surface" technique because electron diffraction is generated within a few tens of nanometers of the sample surface. Therefore, the specimen surface should be exempt of any damages in order to produce EBSD patterns. Here, we present a successful and efficient EBSD sample polishing of two very challenging specimens prepared by broad ion beam milling.
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  • Partner Lab for EM Sample Preparation in Paris
    Science Lab Topic: EM Sample Preparation

    Partner Lab for EM Sample Preparation in Paris

    At the Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie (IMPMC) of the Université Pierre et Marie Curie in Paris an new lab for EM Sample Preparation welcomes researchers of materials sciences and mineralogy: the lab has been equipped with Leica EM TXP target surfacing systems and Leica EM TIC3X ion beam systems.
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  • Analysis of Oil Shale as an Alternative Source of Energy
    Science Lab Topic: EM Sample Preparation

    Analysis of Oil Shale as an Alternative Source of Energy

    For some years now, the search for alternative sources of raw materials has concentrated on oil shale deposits. As the exploitation of these raw materials is still extremely complex and expensive, analysis of oil shale samples is therefore extremely important for identifying the deposit’s potential in advance and optimizing mining methods.
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  • Triple Ion Beam Cutting of Diamond/Al Composites for Interface Characterization
    Science Lab Topic: EM Sample Preparation

    Triple Ion Beam Cutting of Diamond/Al Composites for Interface Characterization

    The microstructure of new materials with heterogenic components is extremely difficult to study. As mechanical polishing often not leads to smooth surfaces, a novel ion beam cutting technique has proven to be very effective. In this article, the applicability of a novel triple ion beam (TIB) cutting technique for a clean metallographic preparation of the diamond/Al composites will be described.
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  • Webinar: Innovative Sample Preparation Method of Heterogeneous Materials for EM Observation
    Science Lab Topic: EM Sample Preparation

    Webinar: Innovative Sample Preparation Method of Heterogeneous Materials for EM Observation

    Sample Preparation is a prerequisite for microscopy. It’s essential for achieving accurate and reproducible results. To get the best results in interfacial characterization, Leica Microsystems developed a triple ion beam cutting technique for electron microscopy observation. This technique is integrated into the ion beam slope cutter Leica EM TIC 3X and optimizes the processing conditions of sample preparation to reveal the nano-sized interfacial features of the specimen.
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  • A Word on Cathodoluminescence
    Science Lab Topic: EM Sample Preparation

    A Word on Cathodoluminescence

    Cathodoluminescence microanalysis is an emerging technique that is fast gaining popularity in the world of materials science. CL is a light emission phenomena resulting from the electron beam excitation of a luminescent material.
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  • University of Wollongong Electron Microscopy Centre
    Science Lab Topic: EM Sample Preparation

    University of Wollongong Electron Microscopy Centre

    The University of Wollongong has a diverse range of materials research programs that includes metallurgy for mining, manufacturing, steel making and transport; polymers for solar cells, energy storage and bionic implants; and superconducting and electronic materials for commercialization, energy storage, telecommunications and medical applications. Electron microscopy is an integral part of this research, due to the chemical and structural information that can be provided down to the atomic scale.
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