Performing Elemental Analysis down to the Micro Scale


If you work in electronic component analysis, you will be familiar with the many challenges posed. Whether you are identifying metallic particles or checking product authenticity, it’s important to get the right information quickly and easily.

In this webinar, Dr. Konstantin Kartaschew will explain how to obtain spatially resolved information on the chemical composition of microstructures using the Chemical Micro Analyzer LIBS-System.

Speaker: Dr. Konstantin Kartaschew

Konstantin Kartaschew is an Advanced Workflow Specialist at Leica Microsystems. He studied Biochemistry at the Ruhr University Bochum (Germany), where he focused on various types of micro-spectroscopic analysis of biological, organic and inorganic samples. After his PhD in physical chemistry, he worked as a product specialist for spectroscopy at a major analytical instrument company, before joining Leica Microsystems in 2019 as a specialist for LIBS (Laser-induced Breakdown Spectroscopy) and other compound microscopy applications.

Key Learnings

  • Component cleanliness: How to identify electrically conductive particles quickly, easily and reliably
  • Corrosion or contamination: How to check the functionality of multilayer systems
  • Beryllium detection: How to reliably detect beryllium where X-ray-based systems fail
  • Original or fake: How to detect fakes by screening solder types
  • Laser Induced Breakdown Spectroscopy – what it is and how your work will benefit

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