Science Lab

Science Lab

Science Lab

Bienvenido al portal de conocimiento de Leica Microsystems. Aquí encontrará investigación científica y material didáctico sobre el tema de la microscopía. El portal ayuda a principiantes, profesionales experimentados y científicos por igual en su trabajo diario y en sus experimentos. Explore tutoriales interactivos y notas de aplicación, descubra los fundamentos de la microscopía, así como las tecnologías de gama alta. Forme parte de la comunidad Science Lab y comparta sus conocimientos.
Electronic component

Top Challenges for Visual Inspection

This article discusses the challenges encountered when performing visual inspection and rework using a microscope. Using the right type of microscope and optical setup is paramount in order to…
Wafer

How to Boost your Microelectronic Component Inspection Performance

Do you need to see more when inspecting silicon wafers or MEMS? Would you like to get sharp and detailed sample images which are similar to those from electron microscopes? Watch this free webinar…
Visual inspection of a PCBA with the Ivesta 3 Greenough stereo microscope.

How to Select the Right Solution for Visual Inspection

This article helps users with the decision-making process when selecting a microscope as a solution for routine visual inspection. Important factors that should be considered are described.

How to Use a Digital Microscope to Streamline Inspection Processes

Watch this webinar for inspiration and expert advice on how to make quality control simpler, quicker, and easier. Learn how to perform comprehensive visual inspection, including comparison,…
An ID card which has been tampered with by counterfeiters who inserted a hologram.

Is that Document Genuine or Fake? How do They Identify Fake Documents?

This article shows how forensic experts use microscopy for analysis to identify counterfeit, fake documents, such as ID cards, passports, visas, certificates, etc. Then they know if it is genuine or…
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