Science Lab

Science Lab

Science Lab

Bienvenido al portal de conocimiento de Leica Microsystems. Aquí encontrará investigación científica y material didáctico sobre el tema de la microscopía. El portal ayuda a principiantes, profesionales experimentados y científicos por igual en su trabajo diario y en sus experimentos. Explore tutoriales interactivos y notas de aplicación, descubra los fundamentos de la microscopía, así como las tecnologías de gama alta. Forme parte de la comunidad Science Lab y comparta sus conocimientos.
Particle analysis with the Visoria M microscope

AI-Based Particle Counting with the Aivaro AI Feature Detection Software Module

The Aivaro AI Feature Detection software module enables fast manual microscope inspection of particulate contamination on various material samples. By training different classes, reflective particles,…
AI-based inspection detects, classifies, and measures defects directly in microscope images of components.

AI Image Analysis for Reliable Defect Detection

AI-based visual inspection with microscopy helps make quality control in industrial environments efficient by reducing manual inspection effort concerning defect detection, classification, and…
Overview of Artificial Intelligence (AI) and Machine Learning

An Overview of Artificial Intelligence (AI) and Machine Learning

AI is rapidly changing industrial inspection, quality control, and manufacturing workflows. But not all AI technologies work the same way. From machine learning and deep learning to the newer concept…
Why the Future of Microscopic Inspection Is AI-Assisted, Not Fully Automated

Why the Future of Microscopic Inspection Is AI-Assisted, Not Fully Automated

The next wave of QC productivity gains will not come from building more automated inspection lines. Instead, it will come from augmenting millions of inspection decisions that are made manually every…
Quality assurance during production in a manufacturing plant.

Quality Assurance Improvement Across Industries

Precision is paramount. Imagine a pacemaker that fails mid-operation or a semiconductor flaw that causes a critical system crash. In industries, such as medical devices, electronics, and…
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