Science Lab

Bem-vindo ao portal de conhecimento da Leica Microsystems. Você encontrará pesquisas científicas e material didático sobre o tema microscopia. O portal oferece suporte a iniciantes, profissionais experientes e cientistas em seus trabalhos e experimentos diários. Explore tutoriais interativos e notas de aplicação, descubra os fundamentos da microscopia, bem como as tecnologias de ponta. Faça parte da comunidade do Science Lab e compartilhe sua experiência.

Optical microscope image, which is a composition of both brightfield and fluorescence illumination, showing organic contamination on a wafer surface. The inset images in the upper left corner show the brightfield image (above) and fluorescence image (below with dark background).

Visualizing Photoresist Residue and Organic Contamination on Wafers

As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…

Image of magnetic steel taken with a 100x objective using Kerr microscopy. The magnetic domains in the grains appear in the image with lighter and darker patterns. A few domains are marked with red arrows. Courtesy of Florian Lang-Melzian, Robert Bosch GmbH, Germany.

Rapidly Visualizing Magnetic Domains in Steel with Kerr Microscopy

The rotation of polarized light after interaction with magnetic domains in a material, known as the Kerr effect, enables the investigation of magnetized samples with Kerr microscopy. It allows rapid…

Region of a patterned wafer inspected using optical microscopy and automated and reproducible DIC (differential interference contrast). With DIC users are able to visualize small height differences on the wafer surface more easily.

6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences

A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…

Dr. Sheybani places the new subconjunctival stent in the anterior chamber. Images courtesy of Arsham Sheybani, MD.

Glaucoma Stent Revision Surgery Guided by Intraoperative OCT

Learn about a glaucoma subconjunctival stent revision guided by intraoperative OCT and the important role it plays to ensure the best outcome.

Safe Wafer Loading for Microscope Inspection without Hand Contact

How automated silicon wafer loading for microscope inspection helps improve microelectronics process control and production efficiency is explained in this article. Manual handling of wafers has a…

Image of burrs (red arrows) at the edge of a battery electrode acquired with a DVM6 digital microscope.

Burr Detection During Battery Manufacturing

See how optical microscopy can be used for burr detection on battery electrodes and determination of damage potential to achieve rapid and reliable quality control during battery manufacturing.

Plastic reconstructive surgery with M530 OHX

Advances in Oncological Reconstructive Surgery

Decision making and patient care in oncological reconstructive surgery have considerably evolved in recent years. New surgical assistance technologies are helping surgeons push the boundaries of what…

Ultramicrotomy eBook: Targeting, Trimming & Alignment

Ultramicrotomy is evolving rapidly, and today’s microscopes demand high‑quality sections, precise targeting, and reproducible workflows. This eBook brings together expert application notes, automated…

Surgical incision in minimally invasive spine surgery (MISS) case. Image courtesy of Dr. A. Alfieri, Chief Physician & Head of Clinic of Neurosurgery & Spinal Surgery, Cantonal Hospital Winterthur, Switzerland.

Flexibility and Efficiency in Minimally Invasive Spine Surgery

According to Prof. Alex Alfieri, Chief Physician and Head of clinic for Neurosurgery and Spinal surgery at the Cantonal Hospital Winterthur, Minimally invasive spine surgery (MISS) is transforming…

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