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Science Lab

Science Lab

Das Wissensportal von Leica Microsystems bietet Ihnen Wissens- und Lehrmaterial zu den Themen der Mikroskopie. Die Inhalte sind so konzipiert, dass sie Einsteiger, erfahrene Praktiker und Wissenschaftler gleichermaßen bei ihrem alltäglichen Vorgehen und Experimenten unterstützen. Entdecken Sie interaktive Tutorials und Anwendungsberichte, erfahren Sie mehr über die Grundlagen der Mikroskopie und High-End-Technologien - werden Sie Teil der Science Lab Community und teilen Sie Ihr Wissen!
Multiplexed Cell DIVE imaging to characterize the spatial landscape in Human Alzheimer’s Cortical Tissue

Probing Human Alzheimer's Cortical Section using Spatial Multiplexing

Alzheimer’s disease (AD) is the most common neurodegenerative disease and is characterized by the progressive decline of cognitive function. Spatial profiling of AD brain may reveal cellular…
Brightfield image of a pig liver stained with hematoxylin-eosin (HE).

Spatial Metabolomics: Exploring Tumor Complexity and Therapeutic Insights

In cancer research, it is vital to understand the interaction between tumor cells and their microenvironment, as the tumor microenvironment influences tumor progression significantly. Spatial…
Mosaic scan of a Masson-Goldner stained cat brain. Magnification: 20x.

Lipidomics Analysis of Sparse Cells based on Laser Microdissection

Delve into cellular intricacies with high-coverage targeted lipidomics analysis of sparse cells. This advanced method, integrating Laser Microdissection (LMD) and Liquid Chromatography-Mass…
Image of confluent cells taken with phase contrast (left) and analyzed for confluency using AI (right).

AI Confluency Analysis for Enhanced Precision in 2D Cell Culture

This article explains how efficient, precise confluency assessment of 2D cell culture can be done with artificial intelligence (AI). Assessing confluency, the percentage of surface area covered,…
AI-based cell counting performed with a phase-contrast and fluorescence image using the Mateo FL microscope.

Precision and Efficiency with AI-Enhanced Cell Counting

This article describes the use of artificial intelligence (AI) for precise and efficient cell counting. Accurate cell counting is important for research with 2D cell cultures, e.g., cellular dynamics,…
AI-based transfection analysis (left) of U2OS cells which were transfected with a fluorescently labelled protein. A fluorescence image of the cells (right) is also shown. The analysis and imaging were performed with Mateo FL.

Leveraging AI for Efficient Analysis of Cell Transfection

This article explores the pivotal role of artificial intelligence (AI) in optimizing transfection efficiency measurements within the context of 2D cell culture studies. Precise and reliable…
Cell DIVE image of stromal remodeling around B cell follicles of follicular lymphoma patients. Stromal cells labeled with antibodies against desmin (red), SPARC (orange), vimentin (blue), and a-sma (yellow). Extracellular matrix labeled with antibody against lumican (cyan). B cells labeled with antibody against CD20 (green). Image credit: Dr. Andrea Radtke, Center for Advanced Tissue Imaging, NIAID, NIH

Empowering Spatial Biology with Open Multiplexing and Cell DIVE

Spatial biology and multiplexed imaging workflows have become important in immuno-oncology research. Many researchers struggle with study efficiency, even with effective tools and protocols. Here, we…
Region of a patterned wafer inspected using optical microscopy and automated and reproducible DIC (differential interference contrast). With DIC users are able to visualize small height differences on the wafer surface more easily.

6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences

A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…
Optical microscope image, which is a composition of both brightfield and fluorescence illumination, showing organic contamination on a wafer surface. The inset images in the upper left corner show the brightfield image (above) and fluorescence image (below with dark background).

Visualizing Photoresist Residue and Organic Contamination on Wafers

As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…
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