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Probing Human Alzheimer's Cortical Section using Spatial Multiplexing
Alzheimer’s disease (AD) is the most common neurodegenerative disease and is characterized by the progressive decline of cognitive function. Spatial profiling of AD brain may reveal cellular…
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Spatial Metabolomics: Exploring Tumor Complexity and Therapeutic Insights
In cancer research, it is vital to understand the interaction between tumor cells and their microenvironment, as the tumor microenvironment influences tumor progression significantly. Spatial…
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Lipidomics Analysis of Sparse Cells based on Laser Microdissection
Delve into cellular intricacies with high-coverage targeted lipidomics analysis of sparse cells. This advanced method, integrating Laser Microdissection (LMD) and Liquid Chromatography-Mass…
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AI Confluency Analysis for Enhanced Precision in 2D Cell Culture
This article explains how efficient, precise confluency assessment of 2D cell culture can be done with artificial intelligence (AI). Assessing confluency, the percentage of surface area covered,…
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Precision and Efficiency with AI-Enhanced Cell Counting
This article describes the use of artificial intelligence (AI) for precise and efficient cell counting. Accurate cell counting is important for research with 2D cell cultures, e.g., cellular dynamics,…
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Leveraging AI for Efficient Analysis of Cell Transfection
This article explores the pivotal role of artificial intelligence (AI) in optimizing transfection efficiency measurements within the context of 2D cell culture studies. Precise and reliable…
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Empowering Spatial Biology with Open Multiplexing and Cell DIVE
Spatial biology and multiplexed imaging workflows have become important in immuno-oncology research. Many researchers struggle with study efficiency, even with effective tools and protocols. Here, we…
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6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences
A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…
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Visualizing Photoresist Residue and Organic Contamination on Wafers
As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…