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Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest.

Structural and Chemical Analysis of IC-Chip Cross Sections

This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…

EBSD grain size distribution of the cross section of a gold wire within a silicon matrix from inside a CPU (central processing unit of a computer). The grains are highlighted with arbitrary colors.

High-Quality EBSD Sample Preparation

This article describes a method for EBSD sample preparation of challenging materials. The high-quality samples required for electron backscatter diffraction are prepared with broad ion-beam milling.

How to Prepare and Analyse Battery Samples with Electron Microscopy

This online workshop is designed for beginners as well as advanced EM users for lithium or novel battery systems, as well as other semiconductor samples requiring high-resolution cross-section…

[Translate to German:] SEM image of the full Li-NMC electrode sample, showing the two porous layers and the metal film at the center of the structure.

Querschnitt-Ionenstrahlfräsen von Batteriekomponenten

Für ein umfassendes Verständnis von Lithiumbatteriesystemen ist eine qualitativ hochwertige Oberflächenpräparation erforderlich, um die innere Struktur und Morphologie zu untersuchen. Aufgrund der…

Workflow Solutions for Sample Preparation Methods for Material Science

This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.