Science Lab
Science Lab
Willkommen auf dem Wissensportal von Leica Microsystems. Hier finden Sie wissenschaftliches Forschungs- und Lehrmaterial rund um das Thema Mikroskopie. Das Portal unterstützt Anfänger, erfahrene Praktiker und Wissenschaftler gleichermaßen bei ihrer täglichen Arbeit und ihren Experimenten. Erkunden Sie interaktive Tutorials und Anwendungshinweise, entdecken Sie die Grundlagen der Mikroskopie ebenso wie High-End-Technologien. Werden Sie Teil der Science Lab Community und teilen Sie Ihr Fachwissen.
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AI-Based Particle Counting with the Aivaro AI Feature Detection Software Module
The Aivaro AI Feature Detection software module enables fast manual microscope inspection of particulate contamination on various material samples. By training different classes, reflective particles,…
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AI Image Analysis for Reliable Defect Detection
AI-based visual inspection with microscopy helps make quality control in industrial environments efficient by reducing manual inspection effort concerning defect detection, classification, and…
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An Overview of Artificial Intelligence (AI) and Machine Learning
AI is rapidly changing industrial inspection, quality control, and manufacturing workflows. But not all AI technologies work the same way. From machine learning and deep learning to the newer concept…
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Why the Future of Microscopic Inspection Is AI-Assisted, Not Fully Automated
The next wave of QC productivity gains will not come from building more automated inspection lines. Instead, it will come from augmenting millions of inspection decisions that are made manually every…
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How to Select the Right Measurement Microscope
With a measurement microscope, users can measure the size and dimensions of sample features in both 2D and 3D, something crucial for inspection, QC, failure analysis, and R&D. However, choosing the…
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Microscope Calibration for Measurements: Why and How You Should Do It
Microscope calibration ensures accurate and consistent measurements for inspection, quality control (QC), failure analysis, and research and development (R&D). Calibration steps are described in this…
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Graterkennung während der Batterieherstellung
Erfahren Sie, wie die optische Mikroskopie zur Graterkennung an Batterieelektroden und zur Bestimmung des Schadenspotenzials eingesetzt werden kann, um eine schnelle und zuverlässige…
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Automotive Part Verification and Development according to Specifications
Automotive part verification during the development and production of parts and components by suppliers or manufacturers is important for ensuring that specifications are met. Specifications are…
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Depth of Field in Microscope Images
For microscopy imaging, depth of field is an important parameter when needing sharp images of sample areas with structures having significant changes in depth. In practice, depth of field is…